Hisatomi Hosaka

Person

Nirasaki-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Reliability evaluation test apparatus, reliability evaluation test...
- Patent number 8,456,186
- Issue date Jun 4, 2013
- Tokyo Electron Limited
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number RE42637
- Issue date Aug 23, 2011
- Tokyo Electron Limited
- Jun Mochizuki
- 324 - Electricity: measuring and testing
Information Patent Grant
Multilayer substrate and probe card
- Patent number 7,750,655
- Issue date Jul 6, 2010
- Tokyo Electron Limited
- Jun Mochizuki
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 7,663,386
- Issue date Feb 16, 2010
- Tokyo Electron Limited
- Hisatomi Hosaka
- G01 - MEASURING TESTING
Information Patent Grant
Method for forming connection pin, probe, connection pin, probe car...
- Patent number 7,629,806
- Issue date Dec 8, 2009
- Tokyo Electron Limited
- Hisatomi Hosaka
- G01 - MEASURING TESTING
Information Patent Grant
Method of producing a probe with a trapezoidal contactor
- Patent number 7,621,045
- Issue date Nov 24, 2009
- Tokyo Electron Limited
- Hisatomi Hosaka
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 7,541,820
- Issue date Jun 2, 2009
- Tokyo Electron Limited
- Takashi Amemiya
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 7,498,827
- Issue date Mar 3, 2009
- Tokyo Electron Limited
- Jun Mochizuki
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 7,474,110
- Issue date Jan 6, 2009
- Tokyo Electron Limited
- Jun Mochizuki
- G01 - MEASURING TESTING
Information Patent Grant
Probe with trapezoidal contractor and device based on application t...
- Patent number 7,256,592
- Issue date Aug 14, 2007
- Tokyo Electron Limited
- Hisatomi Hosaka
- G01 - MEASURING TESTING
Information Patent Grant
Reliability evaluation test apparatus, reliability evaluation test...
- Patent number 7,242,206
- Issue date Jul 10, 2007
- Tokyo Electron Limited
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Grant
Reliability evaluation test apparatus, reliability evaluation test...
- Patent number 7,091,733
- Issue date Aug 15, 2006
- Tokyo Electron Limited
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Grant
Probe system
- Patent number 5,798,651
- Issue date Aug 25, 1998
- Tokyo Electron Limited
- Tsuyoshi Aruga
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CIRCUIT BOARD FOR SEMICONDUCTOR DEVICE INSPECTION APPARATUS AND MAN...
- Publication number 20130206460
- Publication date Aug 15, 2013
- TOKYO ELECTRON LIMTED
- Jun Mochizuki
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Method for Forming Connection Pin, Probe, Connection Pin, Probe Car...
- Publication number 20080284458
- Publication date Nov 20, 2008
- Hisatomi Hosaka
- G01 - MEASURING TESTING
Information Patent Application
Probe Guard
- Publication number 20080258745
- Publication date Oct 23, 2008
- Hisatomi Hosaka
- G01 - MEASURING TESTING
Information Patent Application
Multilayer Substrate and Probe Card
- Publication number 20080191720
- Publication date Aug 14, 2008
- Jun Mochizuki
- G01 - MEASURING TESTING
Information Patent Application
Probe Card
- Publication number 20080150558
- Publication date Jun 26, 2008
- Takashi Amemiya
- G01 - MEASURING TESTING
Information Patent Application
Probe Card
- Publication number 20080048698
- Publication date Feb 28, 2008
- Takashi Amemiya
- G01 - MEASURING TESTING
Information Patent Application
RELIABILITY EVALUATION TEST APPARATUS, RELIABILITY EVALUATION TEST...
- Publication number 20080018355
- Publication date Jan 24, 2008
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Application
Probe card
- Publication number 20070290699
- Publication date Dec 20, 2007
- TOKYO ELECTRON LIMITED
- Jun Mochizuki
- G01 - MEASURING TESTING
Information Patent Application
Probe card
- Publication number 20070290698
- Publication date Dec 20, 2007
- TOKYO ELECTRON LIMITED
- Jun Mochizuki
- G01 - MEASURING TESTING
Information Patent Application
PROBE WITH TRAPEZOIDAL CONTACTOR AND DEVICE BASED ON APPLICATION TH...
- Publication number 20070124932
- Publication date Jun 7, 2007
- TOKYO ELECTRON LIMITED
- Hisatomi HOSAKA
- G01 - MEASURING TESTING
Information Patent Application
PROBE WITH TRAPEZOIDAL CONTACTOR AND DEVICE BASED ON APPLICATION TH...
- Publication number 20070126444
- Publication date Jun 7, 2007
- TOKYO ELECTRON LIMITED
- Hisatomi HOSAKA
- G01 - MEASURING TESTING
Information Patent Application
Reliability evaluation test apparatus, reliability evaluation test...
- Publication number 20050253575
- Publication date Nov 17, 2005
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Application
Probe with trapezoidal contactor and device based on application th...
- Publication number 20050162179
- Publication date Jul 28, 2005
- Hisatomi Hosaka
- G01 - MEASURING TESTING
Information Patent Application
Probe card
- Publication number 20050156613
- Publication date Jul 21, 2005
- Hisatomi Hosaka
- G01 - MEASURING TESTING
Information Patent Application
Reliability evaluation test apparatus, reliability evaluation test...
- Publication number 20040183561
- Publication date Sep 23, 2004
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING
Information Patent Application
Probe arrangement assembly, method of manufacturing probe arrangeme...
- Publication number 20010009376
- Publication date Jul 26, 2001
- Kiyoshi Takekoshi
- G01 - MEASURING TESTING

Hisatomi Hosaka

Person

Patents Grantslast 30 patents

Reliability evaluation test apparatus, reliability evaluation test...

Probe card

Multilayer substrate and probe card

Probe card

Method for forming connection pin, probe, connection pin, probe car...

Method of producing a probe with a trapezoidal contactor

Probe card

Probe card

Probe card

Probe with trapezoidal contractor and device based on application t...

Reliability evaluation test apparatus, reliability evaluation test...

Reliability evaluation test apparatus, reliability evaluation test...

Probe system

Patents Applicationslast 30 patents

CIRCUIT BOARD FOR SEMICONDUCTOR DEVICE INSPECTION APPARATUS AND MAN...

Method for Forming Connection Pin, Probe, Connection Pin, Probe Car...

Probe Guard

Multilayer Substrate and Probe Card

Probe Card

Probe Card

RELIABILITY EVALUATION TEST APPARATUS, RELIABILITY EVALUATION TEST...

Probe card

Probe card

PROBE WITH TRAPEZOIDAL CONTACTOR AND DEVICE BASED ON APPLICATION TH...

PROBE WITH TRAPEZOIDAL CONTACTOR AND DEVICE BASED ON APPLICATION TH...

Reliability evaluation test apparatus, reliability evaluation test...

Probe with trapezoidal contactor and device based on application th...

Probe card

Reliability evaluation test apparatus, reliability evaluation test...

Probe arrangement assembly, method of manufacturing probe arrangeme...