Hisaya Murakami

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Particle detecting device and particle detecting method
- Patent number 9,297,740
- Issue date Mar 29, 2016
- Azbil Corporation
- Hisaya Murakami
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for detecting particles
- Patent number 9,239,405
- Issue date Jan 19, 2016
- Azbil Corporation
- John H. Buchanan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PARTICLE DETECTING DEVICE AND PARTICLE DETECTING METHOD
- Publication number 20140340681
- Publication date Nov 20, 2014
- AZBIL CORPORATION
- Hisaya Murakami
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR DETECTING PARTICLES
- Publication number 20130248693
- Publication date Sep 26, 2013
- JOHN H. BUCHANAN
- G01 - MEASURING TESTING