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Hisayasu MORINO

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Patents Grantslast 30 patents

  • Information Patent Grant

    Optical interference measurement apparatus having optical path leng...
    • Patent number 12,306,343
    • Issue date May 20, 2025
    • Omron Corporation
    • Kazuya Kimura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Confocal sensor
    • Patent number 11,965,729
    • Issue date Apr 23, 2024
    • Omron Corporation
    • Hisayasu Morino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Optical measurement device
    • Patent number 11,674,794
    • Issue date Jun 13, 2023
    • Omron Corporation
    • Hisayasu Morino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Optical measuring device
    • Patent number 11,231,270
    • Issue date Jan 25, 2022
    • Omron Corporation
    • Takahiro Okuda
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Optical measurement device
    • Patent number 10,551,171
    • Issue date Feb 4, 2020
    • Omron Corporation
    • Hisayasu Morino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Confocal measurement device
    • Patent number 10,520,296
    • Issue date Dec 31, 2019
    • Omron Corporation
    • Hisayasu Morino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Confocal measuring device
    • Patent number 10,247,602
    • Issue date Apr 2, 2019
    • Omron Corporation
    • Mariko Marukawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Optical measurement device
    • Patent number 9,995,624
    • Issue date Jun 12, 2018
    • Omron Corporation
    • Hisayasu Morino
    • G02 - OPTICS

Patents Applicationslast 30 patents

  • Information Patent Application

    OPTICAL MEASUREMENT DEVICE
    • Publication number 20230266118
    • Publication date Aug 24, 2023
    • Omron Corporation
    • Hisayasu MORINO
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL MEASUREMENT DEVICE
    • Publication number 20230266119
    • Publication date Aug 24, 2023
    • Omron Corporation
    • Hisayasu MORINO
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL INTERFERENCE RANGE SENSOR
    • Publication number 20230090501
    • Publication date Mar 23, 2023
    • Omron Corporation
    • Yusuke NAGASAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    CONFOCAL SENSOR
    • Publication number 20220011092
    • Publication date Jan 13, 2022
    • Omron Corporation
    • Hisayasu MORINO
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL INTERFERENCE MEASUREMENT APPARATUS
    • Publication number 20210286055
    • Publication date Sep 16, 2021
    • Omron Corporation
    • Kazuya KIMURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL MEASUREMENT DEVICE
    • Publication number 20190346258
    • Publication date Nov 14, 2019
    • Omron Corporation
    • Hisayasu MORINO
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL MEASURING DEVICE
    • Publication number 20190277621
    • Publication date Sep 12, 2019
    • Omron Corporation
    • Takahiro OKUDA
    • G01 - MEASURING TESTING
  • Information Patent Application

    CONFOCAL MEASUREMENT DEVICE
    • Publication number 20190101375
    • Publication date Apr 4, 2019
    • Omron Corporation
    • Hisayasu MORINO
    • G01 - MEASURING TESTING
  • Information Patent Application

    CONFOCAL MEASURING DEVICE
    • Publication number 20180259390
    • Publication date Sep 13, 2018
    • Omron Corporation
    • Mariko MARUKAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL MEASUREMENT DEVICE
    • Publication number 20170276475
    • Publication date Sep 28, 2017
    • Omron Corporation
    • Hisayasu MORINO
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL MEASUREMENT DEVICE
    • Publication number 20170160130
    • Publication date Jun 8, 2017
    • Omron Corporation
    • Hisayasu MORINO
    • G02 - OPTICS