Hisayoshi Oba

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method, storage media storing program, and component for avoiding i...
- Patent number 7,725,865
- Issue date May 25, 2010
- Fujitsu Microelectronics Limited
- Hisayoshi Oba
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Timing analysis apparatus, timing analysis method, and computer pro...
- Patent number 7,401,308
- Issue date Jul 15, 2008
- Fujitsu Limited
- Kenichi Ushiyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device having embedded array
- Patent number 6,934,919
- Issue date Aug 23, 2005
- Fujitsu Limited
- Noboru Yokota
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device having embedded array
- Patent number 6,925,615
- Issue date Aug 2, 2005
- Fujitsu Limited
- Noboru Yokota
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device having embedded array
- Patent number 6,886,142
- Issue date Apr 26, 2005
- Fujitsu Limited
- Noboru Yokota
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device having embedded array
- Patent number 6,555,853
- Issue date Apr 29, 2003
- Fujitsu Limited
- Noboru Yokota
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Terminal layer setting method for semiconductor circuit having a pl...
- Publication number 20060220255
- Publication date Oct 5, 2006
- FUJITSU LIMITED
- Hisayoshi Oba
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Timing analysis apparatus, timing analysis method, and computer pro...
- Publication number 20060064659
- Publication date Mar 23, 2006
- FUJITSU LIMITED
- Kenichi Ushiyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor device having embedded array
- Publication number 20040172606
- Publication date Sep 2, 2004
- FUJITSU LIMITED
- Noboru Yokota
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE HAVING EMBEDDED ARRAY
- Publication number 20030062632
- Publication date Apr 3, 2003
- NOBORU YOKOTA
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device having embedded array
- Publication number 20020087941
- Publication date Jul 4, 2002
- FUJITSU LIMITED
- Noboru Yokota
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device having embedded array
- Publication number 20020084457
- Publication date Jul 4, 2002
- FUJITSU LIMITED
- Noboru Yokota
- G01 - MEASURING TESTING