Hisayuki Kohno

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 7,949,093
- Issue date May 24, 2011
- Rigaku Industrial Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer and program for use therewith
- Patent number 7,450,685
- Issue date Nov 11, 2008
- Rigaku Industrial Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 7,356,114
- Issue date Apr 8, 2008
- Rigaku Industrial Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent X-ray analyzer with path switching device
- Patent number 6,240,159
- Issue date May 29, 2001
- Rigaku Industrial Corporation
- Hisayuki Kohno
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20090116613
- Publication date May 7, 2009
- RIGAKU INDUSTRIAL CORPORATION
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Application
X-ray fluorescence spectrometer and program for use therewith
- Publication number 20070086567
- Publication date Apr 19, 2007
- RIGAKU INDUSTRIAL CORPORATION
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20070058776
- Publication date Mar 15, 2007
- RIGAKU INDUSTRIAL CORPORATION
- Yoshiyuki KATAOKA
- G01 - MEASURING TESTING
Information Patent Application
X-ray fluorescence analyzer
- Publication number 20060153332
- Publication date Jul 13, 2006
- Hisayuki Kohno
- G01 - MEASURING TESTING
Information Patent Application
X-ray fluorescence spectrometer for semiconductors
- Publication number 20030142781
- Publication date Jul 31, 2003
- Naoki Kawahara
- G01 - MEASURING TESTING