Hisayuki SAITO

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Shirakawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for evaluating crystal defects
- Patent number 10,983,158
- Issue date Apr 20, 2021
- Shin-Etsu Handotai Co., Ltd.
- Hisayuki Saito
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method for evaluating warpage of wafer and method for sorting wafer
- Patent number 10,345,102
- Issue date Jul 9, 2019
- Shin-Etsu Handotai Co., Ltd.
- Hisayuki Saito
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for evaluating haze
- Patent number 10,234,281
- Issue date Mar 19, 2019
- Shin-Etsu Handotai Co., Ltd.
- Hisayuki Saito
- G01 - MEASURING TESTING
Information Patent Grant
Silicon wafer and method for producing the same
- Patent number 9,337,013
- Issue date May 10, 2016
- Shin-Etsu Handotai Co., Ltd.
- Izumi Fusegawa
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method for evaluating silicon wafer
- Patent number 8,111,081
- Issue date Feb 7, 2012
- Shin-Etsu Handotai Co., Ltd.
- Hisayuki Saito
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Evaluation method for crystal defect in silicon single crystal wafer
- Patent number 7,718,446
- Issue date May 18, 2010
- Shin-Etsu Handotai Co., Ltd.
- Hisayuki Saito
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR EVALUATING CRYSTAL DEFECTS
- Publication number 20190212384
- Publication date Jul 11, 2019
- Shin-Etsu Handotai Co., Ltd.
- Hisayuki SAITO
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD FOR EVALUATING HAZE
- Publication number 20180128606
- Publication date May 10, 2018
- Shin-Etsu Handotai Co., Ltd.
- Hisayuki SAITO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EVALUATING WARPAGE OF WAFER AND METHOD FOR SORTING WAFER
- Publication number 20170038202
- Publication date Feb 9, 2017
- Shin-Etsu Handotai Co., Ltd.
- Hisayuki SAITO
- G01 - MEASURING TESTING
Information Patent Application
SILICON WAFER AND METHOD FOR PRODUCING THE SAME
- Publication number 20140103492
- Publication date Apr 17, 2014
- Shin-Etsu Handotai Co., Ltd.
- Izumi Fusegawa
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD FOR EVALUATING SILICON WAFER
- Publication number 20100019796
- Publication date Jan 28, 2010
- Shin-Etsu Handotai Co., Ltd.
- Hisayuki Saito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Evaluation Method for Crystal Defect in Silicon Single Crystal Wafer
- Publication number 20080153186
- Publication date Jun 26, 2008
- Hisayuki Saito
- G01 - MEASURING TESTING