Hitesh Suri

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method to transfer failure analysis-specific data between design ho...
- Patent number 8,645,896
- Issue date Feb 4, 2014
- DCG Systems Inc
- Hitesh Suri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Enhanced OP3 algorithms for net cuts, net joins, and probe points f...
- Patent number 7,539,966
- Issue date May 26, 2009
- DCG Systems, Inc.
- Tamal Basu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for determining probing locations on IC
- Patent number 7,257,507
- Issue date Aug 14, 2007
- Credence Systems Corporation
- Hitesh Suri
- G01 - MEASURING TESTING
Information Patent Grant
System and method for determining probing locations on IC
- Patent number 7,243,039
- Issue date Jul 10, 2007
- Credence Systems Corporation
- Hitesh Suri
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method to transfer failure analysis-specific data between data betw...
- Publication number 20090007033
- Publication date Jan 1, 2009
- Hitesh Suri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR INTEGRATED CIRCUIT DESIGN FOR CIRCUIT EDIT
- Publication number 20080028345
- Publication date Jan 31, 2008
- Credence Systems Corporation
- Hitesh Suri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Enhanced OP3 algorithms for net cuts, net joins, and probe points f...
- Publication number 20070283308
- Publication date Dec 6, 2007
- Tamal Basu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING PROBING LOCATIONS ON IC
- Publication number 20070179736
- Publication date Aug 2, 2007
- Credence Systems Corporation
- Hitesh Suri
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING PROBING LOCATIONS ON IC
- Publication number 20070179731
- Publication date Aug 2, 2007
- Credence Systems Corporation
- Hitesh Suri
- G01 - MEASURING TESTING