Hitomi Kawaguchiya

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sample processing method
- Patent number 8,716,681
- Issue date May 6, 2014
- Kabushiki Kaisha Toshiba
- Hitomi Kawaguchiya
- G01 - MEASURING TESTING
Information Patent Grant
Insulated-gate transistor having narrow-bandgap-source
- Patent number 5,698,869
- Issue date Dec 16, 1997
- Kabushiki Kaisha Toshiba
- Makoto Yoshimi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device having cylindrical capacitors
- Patent number 5,629,539
- Issue date May 13, 1997
- Kabushiki Kaisha Toshiba
- Masami Aoki
- H01 - BASIC ELECTRIC ELEMENTS