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Hitoshi Fujihara
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Yamanashi, JP
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last 30 patents
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Patent Grant
Probing device setting a probe card parallel
Patent number
5,410,259
Issue date
Apr 25, 1995
Tokyo Electron Yamanashi Limited
Hitoshi Fujihara
G01 - MEASURING TESTING
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Patent Grant
Probe apparatus with a swinging holder for an object of examination
Patent number
5,404,111
Issue date
Apr 4, 1995
Tokyo Electron Limited
Shigeoki Mori
G01 - MEASURING TESTING