Hitoshi Hachiga

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Location information detecting method and system
- Patent number 7,212,126
- Issue date May 1, 2007
- Uniden Corporation
- Hitoshi Hachiga
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Location information detecting method and system
- Publication number 20060119480
- Publication date Jun 8, 2006
- Hitoshi Hachiga
- G01 - MEASURING TESTING