Hitoshi Iida

Follow

Person

Bedford, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Particle detection method and apparatus
- Patent number 4,772,126
- Issue date Sep 20, 1988
- Inspex Incorporated
- Charly D. Allemand
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting particles on a material
- Patent number 4,377,340
- Issue date Mar 22, 1983
- Hamamatsu Systems, Inc.
- Gary P. Green
- G01 - MEASURING TESTING