Hitoshi Izuru

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit device and test method thereof
- Patent number 7,915,720
- Issue date Mar 29, 2011
- Fujitsu Semiconductor Limited
- Kazuhiro Tashiro
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing method and testing equipment
- Patent number 7,199,600
- Issue date Apr 3, 2007
- Fujitsu Limited
- Hitoshi Izuru
- G01 - MEASURING TESTING
Information Patent Grant
Burn-in system, burn-in control technique, and semiconductor device...
- Patent number 6,462,574
- Issue date Oct 8, 2002
- Fujitsu Limited
- Hitoshi Izuru
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor substrate, manufacturing method of a semiconductor de...
- Publication number 20080227226
- Publication date Sep 18, 2008
- Fujitsu Limited
- Shigeru Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor integrated circuit device and test method thereof
- Publication number 20070170425
- Publication date Jul 26, 2007
- FUJITSU LIMITED
- Kazuhiro Tashiro
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor substrate, manufacturing method of a semiconductor de...
- Publication number 20060097356
- Publication date May 11, 2006
- FUJITSU LIMITED
- Shigeru Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device testing method and testing equipment
- Publication number 20060061379
- Publication date Mar 23, 2006
- FUJITSU LIMITED
- Hitoshi Izuru
- G01 - MEASURING TESTING