Hitoshi Kitayoshi

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
RF tag system which allows a scheduled start RF tag and a remote st...
- Patent number 9,607,186
- Issue date Mar 28, 2017
- Hitoshi Kitayoshi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
RF tag, RF tag reader, and pulse code key detecting circuit, and RF...
- Patent number 8,559,486
- Issue date Oct 15, 2013
- Hitoshi Kitayoshi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Radiowave monitoring method and apparatus
- Patent number 7,187,324
- Issue date Mar 6, 2007
- Advantest Corp.
- Hitoshi Kitayoshi
- G01 - MEASURING TESTING
Information Patent Grant
Field distribution measuring method and device
- Patent number 6,804,617
- Issue date Oct 12, 2004
- Advantest Corporation
- Hitoshi Kitayoshi
- G01 - MEASURING TESTING
Information Patent Grant
Radio hologram observation apparatus and method therefor
- Patent number 6,400,331
- Issue date Jun 4, 2002
- Advantest Corporation
- Hitoshi Kitayoshi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Hologram observation method and hologram observation apparatus and...
- Patent number 6,347,060
- Issue date Feb 12, 2002
- Advantest Corp.
- Hitoshi Kitayoshi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for visualizing radio wave in certain area
- Patent number 6,314,271
- Issue date Nov 6, 2001
- Advantest Corporation
- Hitoshi Kitayoshi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Radio hologram observation apparatus and method therefor
- Patent number 6,275,181
- Issue date Aug 14, 2001
- Advantest Corporation
- Hitoshi Kitayoshi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Radio wave visualizing method and apparatus
- Patent number 6,249,248
- Issue date Jun 19, 2001
- Advantest Corporation
- Hitoshi Kitayoshi
- G01 - MEASURING TESTING
Information Patent Grant
Hologram observation method and hologram observation apparatus
- Patent number 6,198,539
- Issue date Mar 6, 2001
- Advantest Corporation
- Hitoshi Kitayoshi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Radio monitoring method and apparatus
- Patent number 6,188,356
- Issue date Feb 13, 2001
- Advantest Corporation
- Hitoshi Kitayoshi
- G01 - MEASURING TESTING
Information Patent Grant
Hologram observation method for three-dimensional wave source distr...
- Patent number 6,140,960
- Issue date Oct 31, 2000
- Advantest Corporation
- Hitoshi Kitayoshi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Wavesource image visualization method using a partial division fast...
- Patent number 5,974,178
- Issue date Oct 26, 1999
- Advantest Corporation
- Hitoshi Kitayoshi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Radio propagation simulation method, wave field strength inference...
- Patent number 5,752,167
- Issue date May 12, 1998
- Advantest Corporation
- Hitoshi Kitayoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Correlation function measurement method and apparatus, and wave sou...
- Patent number 5,748,314
- Issue date May 5, 1998
- Advantest Corporation
- Hitoshi Kitayoshi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Non-contact type wave signal observation apparatus
- Patent number 5,656,932
- Issue date Aug 12, 1997
- Advantest Corporation
- Hitoshi Kitayoshi
- G01 - MEASURING TESTING
Information Patent Grant
High resolution frequency analyzer and vector spectrum analyzer
- Patent number 5,576,978
- Issue date Nov 19, 1996
- Advantest Corporation
- Hitoshi Kitayoshi
- G01 - MEASURING TESTING
Information Patent Grant
Doppler shift compensation apparatus
- Patent number 5,519,402
- Issue date May 21, 1996
- Advantest Corporation
- Hitoshi Kitayoshi
- G01 - MEASURING TESTING
Information Patent Grant
AC signal generating apparatus for voltage and current standard
- Patent number 5,146,224
- Issue date Sep 8, 1992
- Advantest Corporation
- Hitoshi Kitayoshi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Impedance and transfer characteristic measuring apparatus
- Patent number 5,093,627
- Issue date Mar 3, 1992
- Advantest Corporation
- Hitoshi Kitayoshi
- G01 - MEASURING TESTING
Information Patent Grant
Impedance measuring apparatus
- Patent number 4,947,130
- Issue date Aug 7, 1990
- Advantest Corporation
- Hitoshi Kitayoshi
- G01 - MEASURING TESTING
Information Patent Grant
Signal generator
- Patent number 4,901,027
- Issue date Feb 13, 1990
- Advantest Corporation
- Hitoshi Kitayoshi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Burst signal generator
- Patent number 4,713,788
- Issue date Dec 15, 1987
- Takeda Riken Kogyo Kabushikikaisha
- Toshiharu Kasahara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Signal generator for digital spectrum analyzer
- Patent number 4,539,518
- Issue date Sep 3, 1985
- Takeda Riken Co., Ltd.
- Hitoshi Kitayoshi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
RF TAG SYSTEM
- Publication number 20130314215
- Publication date Nov 28, 2013
- Hitoshi KITAYOSHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RF TAG, RF TAG READER, AND PULSE CODE KEY DETECTING CIRCUIT, AND RF...
- Publication number 20100245052
- Publication date Sep 30, 2010
- Hitoshi Kitayoshi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Field distribution measuring method and device
- Publication number 20030109997
- Publication date Jun 12, 2003
- Hitoshi Kitayoshi
- G01 - MEASURING TESTING
Information Patent Application
Radiowave monitoring method and apparatus
- Publication number 20020115411
- Publication date Aug 22, 2002
- Hitoshi Kitayoshi
- G01 - MEASURING TESTING
Information Patent Application
Radio hologram observation apparatus and method therefor
- Publication number 20010022561
- Publication date Sep 20, 2001
- Hitoshi Kitayoshi
- H01 - BASIC ELECTRIC ELEMENTS

Hitoshi Kitayoshi

Person

Patents Grantslast 30 patents

RF tag system which allows a scheduled start RF tag and a remote st...

RF tag, RF tag reader, and pulse code key detecting circuit, and RF...

Radiowave monitoring method and apparatus

Field distribution measuring method and device

Radio hologram observation apparatus and method therefor

Hologram observation method and hologram observation apparatus and...

Method and apparatus for visualizing radio wave in certain area

Radio hologram observation apparatus and method therefor

Radio wave visualizing method and apparatus

Hologram observation method and hologram observation apparatus

Radio monitoring method and apparatus

Hologram observation method for three-dimensional wave source distr...

Wavesource image visualization method using a partial division fast...

Radio propagation simulation method, wave field strength inference...

Correlation function measurement method and apparatus, and wave sou...

Non-contact type wave signal observation apparatus

High resolution frequency analyzer and vector spectrum analyzer

Doppler shift compensation apparatus

AC signal generating apparatus for voltage and current standard

Impedance and transfer characteristic measuring apparatus

Impedance measuring apparatus

Signal generator

Burst signal generator

Signal generator for digital spectrum analyzer

Patents Applicationslast 30 patents

RF TAG SYSTEM

RF TAG, RF TAG READER, AND PULSE CODE KEY DETECTING CIRCUIT, AND RF...

Field distribution measuring method and device

Radiowave monitoring method and apparatus

Radio hologram observation apparatus and method therefor