Hitoshi Kubota

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for inspecting integrated circuit pattern
- Patent number 7,952,074
- Issue date May 31, 2011
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Method and its apparatus for inspecting defects
- Patent number 7,599,545
- Issue date Oct 6, 2009
- Hitachi High-Technologies Corporation
- Yukihiro Shibata
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method of semiconductor substrate and method and appa...
- Patent number 7,460,220
- Issue date Dec 2, 2008
- Renesas Technology Corporation
- Shunji Maeda
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting integrated circuit pattern
- Patent number 7,417,444
- Issue date Aug 26, 2008
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method of semiconductor substrate and method and appa...
- Patent number 7,180,584
- Issue date Feb 20, 2007
- Renesas Technology Corp.
- Shunji Maeda
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method of semiconductor substrate and method and appa...
- Patent number 7,061,600
- Issue date Jun 13, 2006
- Renesas Technology Corp.
- Shunji Maeda
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting integrated circuit pattern
- Patent number 7,026,830
- Issue date Apr 11, 2006
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting integrated circuit pattern
- Patent number 6,559,663
- Issue date May 6, 2003
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method of semiconductor substrate and method and appa...
- Patent number 6,404,498
- Issue date Jun 11, 2002
- Hitachi, Ltd.
- Shunji Maeda
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting integrated circuit pattern
- Patent number 6,329,826
- Issue date Dec 11, 2001
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Pattern checking method and checking apparatus
- Patent number 6,317,512
- Issue date Nov 13, 2001
- Hitachi, Ltd.
- Shunji Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Manufacturing method of semiconductor substrate and method and appa...
- Patent number 6,263,099
- Issue date Jul 17, 2001
- Hitachi, Ltd.
- Shunji Maeda
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting integrated circuit pattern
- Patent number 6,172,363
- Issue date Jan 9, 2001
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for stability controlling vehicular attitude u...
- Patent number 5,893,896
- Issue date Apr 13, 1999
- Unisia Jecs Corporation
- Masamichi Imamura
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Manufacturing method of semiconductor substrative and method and ap...
- Patent number 5,774,222
- Issue date Jun 30, 1998
- Hitachi, Ltd.
- Shunji Maeda
- G01 - MEASURING TESTING
Information Patent Grant
Pattern checking method and checking apparatus
- Patent number 5,649,022
- Issue date Jul 15, 1997
- Hitachi, Ltd.
- Shunji Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for pattern detection
- Patent number 5,430,548
- Issue date Jul 4, 1995
- Hitachi, Ltd.
- Takashi Hiroi
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting thin film transistor liquid crystal substrate...
- Patent number 5,309,108
- Issue date May 3, 1994
- Hitachi, Ltd.
- Shunji Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for the inspection of defects
- Patent number 5,293,538
- Issue date Mar 8, 1994
- Hitachi, Ltd.
- Hisafumi Iwata
- G01 - MEASURING TESTING
Information Patent Grant
Combination apparatus having a scanning electron microscope therein
- Patent number 5,229,607
- Issue date Jul 20, 1993
- Hitachi, Ltd.
- Hironobu Matsui
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Chipping detection system and method
- Patent number 5,157,735
- Issue date Oct 20, 1992
- Hitachi, Ltd.
- Shunji Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for detecting patterns
- Patent number 5,153,444
- Issue date Oct 6, 1992
- Hitachi, Ltd.
- Shunji Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pneumatic power brake system
- Patent number 4,835,970
- Issue date Jun 6, 1989
- Nissan Motor Co. Ltd.
- Morihiko Shimamura
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method and apparatus for detecting defect in circuit pattern of a m...
- Patent number 4,814,615
- Issue date Mar 21, 1989
- Hitachi, Ltd.
- Satoru Fushimi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of and apparatus for checking geometry of multi-layer patter...
- Patent number 4,791,586
- Issue date Dec 13, 1988
- Hitachi, Ltd.
- Shunji Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hydraulic cylinder with control valve
- Patent number 4,749,237
- Issue date Jun 7, 1988
- Nissan Motor Company, Limited
- Hitoshi Kubota
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Automatic focusing method and apparatus utilizing contrasts of proj...
- Patent number 4,725,722
- Issue date Feb 16, 1988
- Hitachi, Ltd.
- Shunji Maeda
- G02 - OPTICS
Information Patent Grant
Booster unit for moving a vehicle on a slope and method of controll...
- Patent number 4,717,207
- Issue date Jan 5, 1988
- Nissan Motor Co., Ltd.
- Hitoshi Kubota
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Brake pressure control valve of a double piping hydraulic braking s...
- Patent number 4,717,208
- Issue date Jan 5, 1988
- Nissan Motor Co., Ltd.
- Hitoshi Kubota
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Supply passage for brake booster of positive pressure type
- Patent number 4,664,016
- Issue date May 12, 1987
- Jidoshakiki Co., Ltd.
- Yoshio Tobisawa
- B60 - VEHICLES IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR INSPECTING INTEGRATED CIRCUIT PATTERN
- Publication number 20080302964
- Publication date Dec 11, 2008
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Application
Manufacturing method of semiconductor substrate and method and appa...
- Publication number 20070070336
- Publication date Mar 29, 2007
- Shunji Maeda
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for inspecting integrated circuit pattern
- Publication number 20060043982
- Publication date Mar 2, 2006
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Application
Method and its apparatus for inspecting defects
- Publication number 20050052642
- Publication date Mar 10, 2005
- Yukihiro Shibata
- G01 - MEASURING TESTING
Information Patent Application
Manufacturing method of semiconductor substrate and method and appa...
- Publication number 20040075837
- Publication date Apr 22, 2004
- Shunji Maeda
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for inspecting integrated circuit pattern
- Publication number 20030169060
- Publication date Sep 11, 2003
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Application
Manufacturing method of semiconductor substrate and method and appa...
- Publication number 20020154303
- Publication date Oct 24, 2002
- Shunji Maeda
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for inspecting integrated circuit pattern
- Publication number 20020027440
- Publication date Mar 7, 2002
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING

Hitoshi Kubota

Person

Patents Grantslast 30 patents

Method and apparatus for inspecting integrated circuit pattern

Method and its apparatus for inspecting defects

Manufacturing method of semiconductor substrate and method and appa...

Method and apparatus for inspecting integrated circuit pattern

Manufacturing method of semiconductor substrate and method and appa...

Manufacturing method of semiconductor substrate and method and appa...

Method and apparatus for inspecting integrated circuit pattern

Method and apparatus for inspecting integrated circuit pattern

Manufacturing method of semiconductor substrate and method and appa...

Method and apparatus for inspecting integrated circuit pattern

Pattern checking method and checking apparatus

Manufacturing method of semiconductor substrate and method and appa...

Method and apparatus for inspecting integrated circuit pattern

Apparatus and method for stability controlling vehicular attitude u...

Manufacturing method of semiconductor substrative and method and ap...

Pattern checking method and checking apparatus

Method and apparatus for pattern detection

Method of inspecting thin film transistor liquid crystal substrate...

Method and apparatus for the inspection of defects

Combination apparatus having a scanning electron microscope therein

Chipping detection system and method

Method and apparatus for detecting patterns

Pneumatic power brake system

Method and apparatus for detecting defect in circuit pattern of a m...

Method of and apparatus for checking geometry of multi-layer patter...

Hydraulic cylinder with control valve

Automatic focusing method and apparatus utilizing contrasts of proj...

Booster unit for moving a vehicle on a slope and method of controll...

Brake pressure control valve of a double piping hydraulic braking s...

Supply passage for brake booster of positive pressure type

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR INSPECTING INTEGRATED CIRCUIT PATTERN

Manufacturing method of semiconductor substrate and method and appa...

Method and apparatus for inspecting integrated circuit pattern

Method and its apparatus for inspecting defects

Manufacturing method of semiconductor substrate and method and appa...

Method and apparatus for inspecting integrated circuit pattern

Manufacturing method of semiconductor substrate and method and appa...

Method and apparatus for inspecting integrated circuit pattern