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Hitoshi Kuribayashi
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Nagano, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device having improved breakdown voltage and method o...
Patent number
8,080,846
Issue date
Dec 20, 2011
Fuji Electric Co., Ltd.
Koh Yoshikawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for manufacturing a semiconductor device having trenches def...
Patent number
7,510,975
Issue date
Mar 31, 2009
Fuji Electric Holdings Co., Ltd.
Daisuke Kishimoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing a semiconductor device
Patent number
7,410,873
Issue date
Aug 12, 2008
Fuji Electric Holdings Co., Ltd.
Hitoshi Kuribayashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of manufacturing semiconductor device and method of treating...
Patent number
7,368,363
Issue date
May 6, 2008
Fuji Electric Device Technology Co., Ltd.
Reiko Hiruta
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
Publication number
20070290267
Publication date
Dec 20, 2007
Fuji Electric Holdings Co., Ltd.
Koh Yoshikawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for manufacturing semiconductor device with trenches in subs...
Publication number
20060154438
Publication date
Jul 13, 2006
Daisuke Kishimoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of manufacturing a semiconductor device
Publication number
20050106794
Publication date
May 19, 2005
Fuji Electric Holdings Co., Ltd.
Hitoshi Kuribayashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of manufacturing semiconductor device and method of treating...
Publication number
20050106847
Publication date
May 19, 2005
Reiko Hiruta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of manufacturing a semiconductor device
Publication number
20030219948
Publication date
Nov 27, 2003
Hitoshi Kuribayashi
H01 - BASIC ELECTRIC ELEMENTS