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Hitoshi KURUSU

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  • Tokyo, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20220385286
    • Publication date Dec 1, 2022
    • Mitsubishi Electric Corporation
    • Hitoshi KURUSU
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    CURRENT REUSE TYPE FIELD EFFECT TRANSISTOR AMPLIFIER
    • Publication number 20200119694
    • Publication date Apr 16, 2020
    • Mitsubishi Electric Corporation
    • Hitoshi KURUSU
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
    • Publication number 20200020632
    • Publication date Jan 16, 2020
    • Mitsubishi Electric Corporation
    • Kazuhiro MAEDA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    INTEGRATED CIRCUIT
    • Publication number 20170310279
    • Publication date Oct 26, 2017
    • Mitsubishi Electric Corporation
    • Takumi SUGITANI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    FREQUENCY MULTIPLIER
    • Publication number 20170149420
    • Publication date May 25, 2017
    • Mitsubishi Electric Corporation
    • Hitoshi KURUSU
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    FREQUENCY MULTIPLIER
    • Publication number 20160241221
    • Publication date Aug 18, 2016
    • Mitsubishi Electric Corporation
    • Hitoshi KURUSU
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    TRANSISTOR
    • Publication number 20130264682
    • Publication date Oct 10, 2013
    • Mitsubishi Electric Corporation
    • Yoshinobu Sasaki
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    DIRECTIONAL COUPLER
    • Publication number 20110057746
    • Publication date Mar 10, 2011
    • Mitsubishi Electric Corporation
    • Kazuya Yamamoto
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SEMICONDUCTOR DEVICES AND METHODS FOR INSPECTING THE SAME
    • Publication number 20080246554
    • Publication date Oct 9, 2008
    • Mitsubishi Electric Corporation
    • Yoshihiro Notani
    • G01 - MEASURING TESTING
  • Information Patent Application

    CALIBRATION PATTERN AND CALIBRATION JIG
    • Publication number 20070103144
    • Publication date May 10, 2007
    • Mitsubishi Electric Corporation
    • Hiroyuki HOSHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Property measurement method for high frequency circuit, calibration...
    • Publication number 20050258819
    • Publication date Nov 24, 2005
    • Mitsubishi Denki Kabushiki Kaisha
    • Hiroyuki Hoshi
    • G01 - MEASURING TESTING
  • Information Patent Application

    Semiconductor integrated circuit device and printed wired board for...
    • Publication number 20030111727
    • Publication date Jun 19, 2003
    • Mitsubishi Denki Kabushiki Kaisha
    • Hitoshi Kurusu
    • Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...