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Hitoshi NAKATSUKA
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Kawanishi-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Three-dimensional measurement device, sensor device for three-dimen...
Patent number
11,262,193
Issue date
Mar 1, 2022
Omron Corporation
Motoharu Okuno
G01 - MEASURING TESTING
Information
Patent Grant
Measurement system and measurement method
Patent number
11,023,706
Issue date
Jun 1, 2021
Omron Corporation
Hitoshi Nakatsuka
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Measurement system and measurement method
Patent number
10,867,225
Issue date
Dec 15, 2020
Omron Corporation
Yutaka Kato
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
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Patent Application
OPTICAL ASSEMBLY FOR THREE-DIMENSIONAL MEASUREMENT DEVICE AND THREE...
Publication number
20220397739
Publication date
Dec 15, 2022
Omron Corporation
Takeshi INODA
G01 - MEASURING TESTING
Information
Patent Application
THREE-DIMENSIONAL MEASUREMENT DEVICE, SENSOR DEVICE FOR THREE-DIMEN...
Publication number
20210262786
Publication date
Aug 26, 2021
Omron Corporation
Motoharu OKUNO
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT SYSTEM AND MEASUREMENT METHOD
Publication number
20200042847
Publication date
Feb 6, 2020
Omron Corporation
Yutaka KATO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEASUREMENT SYSTEM AND MEASUREMENT METHOD
Publication number
20190392193
Publication date
Dec 26, 2019
Omron Corporation
Hitoshi NAKATSUKA
G06 - COMPUTING CALCULATING COUNTING