Hitoshi Namai

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Image analysis apparatus and charged particle beam apparatus
- Patent number 10,724,856
- Issue date Jul 28, 2020
- HITACHI HIGH-TECH CORPORATION
- Atsuko Yamaguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning electron microscope
- Patent number 10,186,399
- Issue date Jan 22, 2019
- Hitachi High-Technologies Corporation
- Mayuka Osaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern measurement device and computer program
- Patent number 10,096,451
- Issue date Oct 9, 2018
- Hitachi High-Technologies Corporation
- Hitoshi Namai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern determination device and computer program
- Patent number 9,329,034
- Issue date May 3, 2016
- Hitachi High-Technologies Corporation
- Hitoshi Namai
- G01 - MEASURING TESTING
Information Patent Grant
Edge detection technique and charged particle radiation equipment
- Patent number 8,953,855
- Issue date Feb 10, 2015
- Hitachi High-Technologies Corporation
- Hitoshi Namai
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
PROCESSOR SYSTEM, SEMICONDUCTOR INSPECTION SYSTEM, AND PROGRAM
- Publication number 20230230886
- Publication date Jul 20, 2023
- HITACHI HIGH-TECH CORPORATION
- Kenji YASUI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE ANALYSIS APPARATUS AND CHARGED PARTICLE BEAM APPARATUS
- Publication number 20190204247
- Publication date Jul 4, 2019
- Hitachi High-Technologies Corporation
- Atsuko YAMAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20170301513
- Publication date Oct 19, 2017
- Hitachi High-Technologies Corporation
- Mayuka OSAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pattern Measurement Device and Computer Program
- Publication number 20160307730
- Publication date Oct 20, 2016
- Hitachi High-Technologies Corporation
- Hitoshi NAMAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN DETERMINATION DEVICE AND COMPUTER PROGRAM
- Publication number 20130270436
- Publication date Oct 17, 2013
- Hitachi High-Technologies Corporation
- Hitoshi Namai
- G01 - MEASURING TESTING
Information Patent Application
EDGE DETECTION TECHNIQUE AND CHARGED PARTICLE RADIATION EQUIPMENT
- Publication number 20090226096
- Publication date Sep 10, 2009
- Hitoshi NAMAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Simulation apparatus
- Publication number 20070103463
- Publication date May 10, 2007
- Fumiko Beniyama
- G06 - COMPUTING CALCULATING COUNTING

Hitoshi Namai

Person

Patents Grantslast 30 patents

Image analysis apparatus and charged particle beam apparatus

Scanning electron microscope

Pattern measurement device and computer program

Pattern determination device and computer program

Edge detection technique and charged particle radiation equipment

Patents Applicationslast 30 patents

PROCESSOR SYSTEM, SEMICONDUCTOR INSPECTION SYSTEM, AND PROGRAM

IMAGE ANALYSIS APPARATUS AND CHARGED PARTICLE BEAM APPARATUS

SCANNING ELECTRON MICROSCOPE

Pattern Measurement Device and Computer Program

PATTERN DETERMINATION DEVICE AND COMPUTER PROGRAM

EDGE DETECTION TECHNIQUE AND CHARGED PARTICLE RADIATION EQUIPMENT

Simulation apparatus