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Hitoshi Nohmi
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Image processor and image processing method for synthetic aperture...
Patent number
8,179,301
Issue date
May 15, 2012
NEC Corporation
Shingo Matsuo
G01 - MEASURING TESTING
Information
Patent Grant
Millimeter wave image processor and millimeter wave image processin...
Patent number
7,656,346
Issue date
Feb 2, 2010
NEC Corporation
Hitoshi Nohmi
G01 - MEASURING TESTING
Information
Patent Grant
Interferometer-type radar
Patent number
7,436,348
Issue date
Oct 14, 2008
NEC Corporation
Hitoshi Nohmi
G01 - MEASURING TESTING
Information
Patent Grant
Interferometer-type radar
Patent number
7,394,422
Issue date
Jul 1, 2008
NEC Corporation
Hitoshi Nohmi
G01 - MEASURING TESTING
Information
Patent Grant
Image synthesizing method using a plurality of reflection radar wav...
Patent number
6,166,677
Issue date
Dec 26, 2000
NEC Corporation
Takeshi Kikuchi
G01 - MEASURING TESTING
Information
Patent Grant
Data flow processor with a full-to-half word convertor
Patent number
5,341,506
Issue date
Aug 23, 1994
NEC Corporation
Hitoshi Nohmi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Synthetic aperture radar image processing system
Patent number
4,594,593
Issue date
Jun 10, 1986
Nippon Electric Co., Ltd.
Hitoshi Nohmi
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Patents Applications
last 30 patents
Information
Patent Application
CONNECTION ADAPTER AND HORN ANTENNA MEASUREMENT DEVICE
Publication number
20240003951
Publication date
Jan 4, 2024
Institute for Q-shu Pioneers of Space, Inc.
Masahiko Uetsuhara
G01 - MEASURING TESTING
Information
Patent Application
Image processor and image processing method for synthetic aperture...
Publication number
20070268305
Publication date
Nov 22, 2007
NEC Corporation
Shingo Matsuo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Millimeter wave image processor and millimeter wave image processin...
Publication number
20070222671
Publication date
Sep 27, 2007
NEC Corporation
Hitoshi Nohmi
G01 - MEASURING TESTING
Information
Patent Application
Interferometer-type rader
Publication number
20060220949
Publication date
Oct 5, 2006
NEC Corporation
Hitoshi Nohmi
G01 - MEASURING TESTING
Information
Patent Application
Interferometer-type radar
Publication number
20060220946
Publication date
Oct 5, 2006
NEC Corporation
Hitoshi Nohmi
G01 - MEASURING TESTING