Hitoshi Ohtake

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Hitachinaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Display device, information terminal, personal information protecti...
- Patent number 11,947,703
- Issue date Apr 2, 2024
- HITACHI HIGH-TECH CORPORATION
- Masaharu Nishida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic analyzer and method for using the same
- Patent number 9,063,106
- Issue date Jun 23, 2015
- Hitachi High-Technologies, Corporation
- Kenichi Yagi
- G01 - MEASURING TESTING
Information Patent Grant
Specimen rack and specimen carrier system
- Patent number 8,216,511
- Issue date Jul 10, 2012
- Hitachi High-Technologies Corporation
- Kiyoteru Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer
- Patent number 7,776,264
- Issue date Aug 17, 2010
- Hitachi High-Technologies Corporation
- Masaki Shiba
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Display Device, Information Terminal, Personal Information Protecti...
- Publication number 20210312079
- Publication date Oct 7, 2021
- Hitachi High-Tech Corporation
- Masaharu NISHIDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATIC ANALYZER AND METHOD FOR USING THE SAME
- Publication number 20090035867
- Publication date Feb 5, 2009
- Kenichi Yagi
- G01 - MEASURING TESTING
Information Patent Application
Specimen Rack and Specimen Carrier System
- Publication number 20080299007
- Publication date Dec 4, 2008
- Kiyoteru Noguchi
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Automatic analyzer
- Publication number 20050175503
- Publication date Aug 11, 2005
- Masaki Shiba
- G01 - MEASURING TESTING