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Hitoshi OTAKE
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Hitachinaka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Automatic analyzer
Patent number
10,605,817
Issue date
Mar 31, 2020
Hitachi High-Technologies Corporation
Masaki Shiba
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Sample dispensing apparatus and automatic analyzer including the same
Patent number
10,309,979
Issue date
Jun 4, 2019
Hitachi High-Technologies Corporation
Hideyuki Yanami
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Automatic analyzer
Patent number
10,151,766
Issue date
Dec 11, 2018
Hitachi High-Technologies Corporation
Masaki Shiba
G01 - MEASURING TESTING
Information
Patent Grant
Sample dispensing apparatus and automatic analyzer including the same
Patent number
9,817,013
Issue date
Nov 14, 2017
Hitachi High-Technologies Corporation
Hideyuki Yanami
G01 - MEASURING TESTING
Information
Patent Grant
Reagent transfer device
Patent number
9,513,302
Issue date
Dec 6, 2016
Hitachi High-Technologies Corporation
Masaki Shiba
G01 - MEASURING TESTING
Information
Patent Grant
Sample dispensing apparatus and automatic analyzer including the same
Patent number
8,691,148
Issue date
Apr 8, 2014
Hitachi High-Technologies Corporation
Hideyuki Yanami
G01 - MEASURING TESTING
Information
Patent Grant
Sample dispensing apparatus and automatic analyzer including the same
Patent number
8,197,754
Issue date
Jun 12, 2012
Hitachi High-Technologies Corporation
Hideyuki Yanami
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer
Patent number
8,158,058
Issue date
Apr 17, 2012
Hitachi High-Technologies Corporation
Masaki Shiba
G01 - MEASURING TESTING
Information
Patent Grant
Sample dispensing apparatus and automatic analyzer including the same
Patent number
7,824,915
Issue date
Nov 2, 2010
Hitachi, Ltd.
Hideyuki Yanami
G01 - MEASURING TESTING
Information
Patent Grant
Bacteriological examination system
Patent number
7,054,756
Issue date
May 30, 2006
Hitachi, Ltd.
Kazuyuki Shimada
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20200141959
Publication date
May 7, 2020
Masaki SHIBA
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20190072576
Publication date
Mar 7, 2019
Masaki Shiba
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Application
SAMPLE DISPENSING APPARATUS AND AUTOMATIC ANALYZER INCLUDING THE SAME
Publication number
20180038882
Publication date
Feb 8, 2018
Hitachi High-Technologies Corporation
Hideyuki YANAMI
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20170010292
Publication date
Jan 12, 2017
Hitachi High-Technologies Corporation
Masaki SHIBA
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE DISPENSING APPARATUS AND AUTOMATIC ANALYZER INCLUDING THE SAME
Publication number
20140170022
Publication date
Jun 19, 2014
Hitachi High-Technologies Corporation
Hideyuki YANAMI
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE DISPENSING APPARATUS AND AUTOMATIC ANALYZER INCLUDING THE SAME
Publication number
20120230873
Publication date
Sep 13, 2012
Hitachi High-Technologies Corporation
Hideyuki YANAMI
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20120183438
Publication date
Jul 19, 2012
Hitachi High-Technologies Corporation
Masaki SHIBA
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE DISPENSING APPARATUS AND AUTOMATIC ANALYZER INCLUDING THE SAME
Publication number
20110014085
Publication date
Jan 20, 2011
Hitachi, Ltd
Hideyuki Yanami
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20080208481
Publication date
Aug 28, 2008
Toshiro NAKANO
G01 - MEASURING TESTING
Information
Patent Application
Automatic analyzer
Publication number
20040253146
Publication date
Dec 16, 2004
Masaki Shiba
G01 - MEASURING TESTING
Information
Patent Application
Sample dispensing apparatus and automatic analyzer including the same
Publication number
20040245275
Publication date
Dec 9, 2004
Hideyuki Yanami
G01 - MEASURING TESTING
Information
Patent Application
Bacteriological examination system
Publication number
20020164676
Publication date
Nov 7, 2002
Hitachi, Ltd.
Kazuyuki Shimada
G01 - MEASURING TESTING