Hitoshi Sato

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Aomori, JP

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Patents Grantslast 30 patents

Information Patent Grant
Electric connecting apparatus
- Patent number 7,924,034
- Issue date Apr 12, 2011
- Kabushiki Kaisha Nihon Micronics
- Kiyotoshi Miura
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connecting apparatus
- Patent number 7,859,282
- Issue date Dec 28, 2010
- Kabushiki Kaisha Nihon Micronics
- Kiyotoshi Miura
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connecting apparatus
- Patent number 7,843,198
- Issue date Nov 30, 2010
- Kabushiki Kaisha Nihon Micronics
- Hitoshi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Probe assembly, method of producing it and electrical connecting ap...
- Patent number 7,667,472
- Issue date Feb 23, 2010
- Kabushiki Kaisha Nihon Micronics
- Kiyotoshi Miura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRICAL CONNECTING APPARATUS
- Publication number 20100134121
- Publication date Jun 3, 2010
- KABUSHIKI KAISHA NIHON MICRONICS
- Hitoshi Sato
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTING APPARATUS
- Publication number 20100066396
- Publication date Mar 18, 2010
- Kabushiki Kaisha Nihon Micronics
- Kiyotoshi Miura
- G01 - MEASURING TESTING
Information Patent Application
ELECTRIC CONNECTING APPARATUS
- Publication number 20090160469
- Publication date Jun 25, 2009
- Kabushiki Kaisha Nihon Micronics
- Kiyotoshi Miura
- G01 - MEASURING TESTING
Information Patent Application
PROBE ASSEMBLY, METHOD OF PRODUCING IT AND ELECTRICAL CONNECTING AP...
- Publication number 20090058440
- Publication date Mar 5, 2009
- Kabushiki Kaisha Nihon Micronics
- Kiyotoshi Miura
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTING APPARATUS
- Publication number 20080197869
- Publication date Aug 21, 2008
- Kabushiki Kaisha Nihon Micronics
- Yuji MIYAGI
- G01 - MEASURING TESTING