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Hitoshi SUGAHARA
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Image processing system and computer program for performing image p...
Patent number
11,836,906
Issue date
Dec 5, 2023
HITACHI HIGH-TECH CORPORATION
Shinichi Shinoda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Image generation method, non-transitory computer-readable medium, a...
Patent number
11,443,917
Issue date
Sep 13, 2022
HITACHI HIGH-TECH CORPORATION
Chikako Abe
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Image processing system and computer program for performing image p...
Patent number
11,176,405
Issue date
Nov 16, 2021
HITACHI HIGH-TECH CORPORATION
Shinichi Shinoda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Exposure condition evaluation device
Patent number
10,558,127
Issue date
Feb 11, 2020
Hitachi High-Technologies Corporation
Shinichi Shinoda
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Pattern-measuring apparatus and semiconductor-measuring system
Patent number
10,445,875
Issue date
Oct 15, 2019
Hitachi High-Technologies Corporation
Yasutaka Toyoda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Pattern measurement condition setting device and pattern measuring...
Patent number
10,190,875
Issue date
Jan 29, 2019
Hitachi High-Technologies Corporation
Shinichi Shinoda
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Pattern-measuring apparatus and semiconductor-measuring system
Patent number
9,990,708
Issue date
Jun 5, 2018
Hitachi High-Technologies Corporation
Yasutaka Toyoda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Pattern measurement device and pattern measurement method
Patent number
8,959,461
Issue date
Feb 17, 2015
Hitachi High-Technologies Corporation
Takuma Shibahara
G01 - MEASURING TESTING
Information
Patent Grant
Pattern measuring apparatus, and pattern measuring method and program
Patent number
8,942,464
Issue date
Jan 27, 2015
Hitachi High-Technologies Corporation
Takuma Shibahara
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
IMAGE PROCESSING SYSTEM AND COMPUTER PROGRAM FOR PERFORMING IMAGE P...
Publication number
20220036116
Publication date
Feb 3, 2022
HITACHI HIGH-TECH CORPORATION
Shinichi SHINODA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Image Generation Method, Non-Transitory Computer-Readable Medium, a...
Publication number
20210043418
Publication date
Feb 11, 2021
HITACHI HIGH-TECH CORPORATION
Chikako ABE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGE PROCESSING SYSTEM AND COMPUTER PROGRAM FOR PERFORMING IMAGE P...
Publication number
20200134355
Publication date
Apr 30, 2020
Hitachi High-Technologies Corporation
Shinichi SHINODA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Charged Particle Beam Device
Publication number
20190362938
Publication date
Nov 28, 2019
Hitachi High-Technologies Corporation
Chikako ABE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Pattern-Measuring Apparatus and Semiconductor-Measuring System
Publication number
20180247400
Publication date
Aug 30, 2018
Hitachi High-Technologies Corporation
Yasutaka TOYODA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Exposure Condition Evaluation Device
Publication number
20170336717
Publication date
Nov 23, 2017
Hitachi High-Technologies Corporation
Shinichi SHINODA
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
PATTERN MEASUREMENT CONDITION SETTING DEVICE AND PATTERN MEASURING...
Publication number
20170160082
Publication date
Jun 8, 2017
Hitachi High-Technologies Corporation
Shinichi SHINODA
G01 - MEASURING TESTING
Information
Patent Application
Pattern-Measuring Apparatus and Semiconductor-Measuring System
Publication number
20160005157
Publication date
Jan 7, 2016
Hitachi High-Technologies Corporation
Yasutaka TOYODA
G01 - MEASURING TESTING
Information
Patent Application
PATTERN MEASUREMENT DEVICE AND PATTERN MEASUREMENT METHOD
Publication number
20140224986
Publication date
Aug 14, 2014
Takuma Shibahara
G01 - MEASURING TESTING
Information
Patent Application
PATTERN MEASURING APPARATUS, AND PATTERN MEASURING METHOD AND PROGRAM
Publication number
20130223723
Publication date
Aug 29, 2013
Hitachi High-Technologies Corporation
Takuma Shibahara
G01 - MEASURING TESTING
Information
Patent Application
DATA PROCESSING SYSTEM, DATA PROCESSING METHOD, AND INSPECTION ASSI...
Publication number
20110150318
Publication date
Jun 23, 2011
Tomohiro Funakoshi
G01 - MEASURING TESTING
Information
Patent Application
Data Processor and Data Processing Method
Publication number
20080226158
Publication date
Sep 18, 2008
Hitachi High-Technologies Corporation
Chikako ABE
G06 - COMPUTING CALCULATING COUNTING