Hitoshi Takeuchi

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Fujisawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
ABERRATION MEASURING APPARATUS, ABERRATION MEASURING METHOD, PROJEC...
- Patent number 6,819,414
- Issue date Nov 16, 2004
- Nikon Corporation
- Hitoshi Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Photomask, aberration correction plate, exposure apparatus, and pro...
- Patent number 6,653,024
- Issue date Nov 25, 2003
- Nikon Corporation
- Naomasa Shiraishi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Vibration reduction device
- Patent number 5,930,530
- Issue date Jul 27, 1999
- Nikon Corporation
- Shinichi Hirano
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, PROGR...
- Publication number 20230237657
- Publication date Jul 27, 2023
- Terumo Kabushiki Kaisha
- Yuki SAKAGUCHI
- G06 - COMPUTING CALCULATING COUNTING