Hitoshi Tanaka

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Test circuit for semiconductor device
- Patent number 7,437,645
- Issue date Oct 14, 2008
- Oki Electric Industry Co., Ltd.
- Hiroyuki Fukuyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Reset circuit and integrated circuit device with reset function
- Patent number 7,333,372
- Issue date Feb 19, 2008
- Oki Electric Industry Co., Ltd.
- Hitoshi Tanaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test circuit for semiconductor device
- Patent number 7,249,295
- Issue date Jul 24, 2007
- Oki Electric Industry Co., Ltd.
- Hiroyuki Fukuyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuit provided with built-in self test function
- Patent number 7,114,113
- Issue date Sep 26, 2006
- Oki Electric Industry Co., Ltd.
- Takeru Yonaga
- G01 - MEASURING TESTING
Information Patent Grant
Boundary scan circuit
- Patent number 7,032,147
- Issue date Apr 18, 2006
- Oki Electric Industry Co., Ltd.
- Hitoshi Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Memory control circuit outputting contents of a control register
- Patent number 7,013,369
- Issue date Mar 14, 2006
- Oki Electric Industy Co., Ltd.
- Hitoshi Tanaka
- G11 - INFORMATION STORAGE
Information Patent Grant
Air conditioning control unit
- Patent number 5,797,717
- Issue date Aug 25, 1998
- Yamatake - Honeywell Co., Ltd.
- Hitoshi Tanaka
- F24 - HEATING RANGES VENTILATING

Patents Applicationslast 30 patents

Information Patent Application
Test circuit for semiconductor device
- Publication number 20070208966
- Publication date Sep 6, 2007
- Hiroyuki Fukuyama
- G11 - INFORMATION STORAGE
Information Patent Application
Reset circuit and integrated circuit device with reset function
- Publication number 20050105348
- Publication date May 19, 2005
- Oki Electric Industry Co., Ltd.
- Hitoshi Tanaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Test circuit for semiconductor device
- Publication number 20040097093
- Publication date May 20, 2004
- Hiroyuki Fukuyama
- G11 - INFORMATION STORAGE
Information Patent Application
Test circuit provided with built-in self test function
- Publication number 20040044491
- Publication date Mar 4, 2004
- Takeru Yonaga
- G01 - MEASURING TESTING
Information Patent Application
Boundary scan circuit
- Publication number 20040010740
- Publication date Jan 15, 2004
- Hitoshi Tanaka
- G01 - MEASURING TESTING
Information Patent Application
Memory control circuit
- Publication number 20020152351
- Publication date Oct 17, 2002
- Hitoshi Tanaka
- G11 - INFORMATION STORAGE