Hitoshi Tanaka

Person

Hyogo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Code reading pattern and an image pickup apparatus for reading the...
- Patent number 5,481,095
- Issue date Jan 2, 1996
- Mitsubishi Denki Kabushiki Kaisha
- Hiroshi Mitsuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of manufacturing a spatial frequency filter for use in a pat...
- Patent number 5,379,150
- Issue date Jan 3, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Yoko Miyazaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern defect detection device and a spatial frequency filter used...
- Patent number 5,289,260
- Issue date Feb 22, 1994
- Mitsubishi Denki Kabushiki Kaisha
- Yoko Miyazaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection device for detecting defects in a periodic pattern on a...
- Patent number 5,170,063
- Issue date Dec 8, 1992
- Mitsubishi Denki Kabushiki Kaisha
- Yoko Miyazaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System for detecting minute particles on or above a substrate
- Patent number 5,008,558
- Issue date Apr 16, 1991
- Mitsubishi Denki Kabushiki Kaisha
- Masao Koshinaka
- G01 - MEASURING TESTING
Information Patent Grant
System for detecting defects in a regularly arranged pattern such a...
- Patent number 4,929,081
- Issue date May 29, 1990
- Mitsubishi Denki Kabushiki Kaisha
- Yoko Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
System for displaying tool parameters of tools utilized in a machin...
- Patent number 4,591,989
- Issue date May 27, 1986
- Mitsubishi Denki Kabushiki Kaisha
- Hitoshi Tanaka
- G05 - CONTROLLING REGULATING

Hitoshi Tanaka

Person

Patents Grantslast 30 patents

Code reading pattern and an image pickup apparatus for reading the...

Method of manufacturing a spatial frequency filter for use in a pat...

Pattern defect detection device and a spatial frequency filter used...

Inspection device for detecting defects in a periodic pattern on a...

System for detecting minute particles on or above a substrate

System for detecting defects in a regularly arranged pattern such a...

System for displaying tool parameters of tools utilized in a machin...