TREA

Hitoshi Tokieda

Follow

Person

  • Hitachinaka-shi, JP
People

Patents Grantslast 30 patents

  • Information Patent Grant

    Ultrasonic cleaner and automatic analyzer using the same
    • Patent number 11,389,838
    • Issue date Jul 19, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Yosuke Horie
    • B08 - CLEANING
  • Information Patent Grant

    Automatic analyzer and sample-processing system
    • Patent number 11,391,750
    • Issue date Jul 19, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Hitoshi Tokieda
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer and reagent bottle loading method
    • Patent number 11,175,301
    • Issue date Nov 16, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Takamichi Mori
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,009,515
    • Issue date May 18, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Takuya Takahashi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,962,558
    • Issue date Mar 30, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Ultrasonic cleaner and automatic analyzer using the same
    • Patent number 10,786,835
    • Issue date Sep 29, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Yosuke Horie
    • B08 - CLEANING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,613,108
    • Issue date Apr 7, 2020
    • Hitachi High-Technologies Corporation
    • Takamichi Mori
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sampling nozzle, automatic analyzer using the same, and method of m...
    • Patent number 10,539,584
    • Issue date Jan 21, 2020
    • Hitachi High-Technologies Corporation
    • Yosuke Horie
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer device
    • Patent number 10,302,668
    • Issue date May 28, 2019
    • Hitachi High-Technologies Corporation
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 10,184,948
    • Issue date Jan 22, 2019
    • Hitachi High-Technologies Corporation
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer and sample-processing system
    • Patent number 10,094,846
    • Issue date Oct 9, 2018
    • Hitachi High-Technologies Corporation
    • Hitoshi Tokieda
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,891,240
    • Issue date Feb 13, 2018
    • Hitachi High-Technologies Corporation
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,869,686
    • Issue date Jan 16, 2018
    • Hitachi High-Technologies Corporation
    • Takamichi Mori
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,772,264
    • Issue date Sep 26, 2017
    • Hitachi High-Technologies Corporation
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 9,442,128
    • Issue date Sep 13, 2016
    • Hitachi High-Technologies Corporation
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer and sample-processing system
    • Patent number 9,229,019
    • Issue date Jan 5, 2016
    • Hitach High-Technologies Corporation
    • Hitoshi Tokieda
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,063,104
    • Issue date Jun 23, 2015
    • Hitachi High-Technologies Corporation
    • Masashi Akutsu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,039,970
    • Issue date May 26, 2015
    • Hitachi High-Technologies Corporation
    • Hitoshi Tokieda
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzing system
    • Patent number 9,031,794
    • Issue date May 12, 2015
    • Hitachi High-Technologies Corporation
    • Osamu Watabe
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer and sample-processing system
    • Patent number 8,701,504
    • Issue date Apr 22, 2014
    • Hitachi High-Technologies Corporation
    • Hitoshi Tokieda
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Input and output buffer module for clinical analyzer
    • Patent number D685495
    • Issue date Jul 2, 2013
    • Hitachi High-Technologies Corporation
    • Mitsuru Oonuma
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Cover for reagent disk for clinical analyzer
    • Patent number D685494
    • Issue date Jul 2, 2013
    • Hitachi High-Technologies Corporation
    • Mitsuru Oonuma
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Clinical analyzer
    • Patent number D681226
    • Issue date Apr 30, 2013
    • Hitachi High-Technologies Corporation
    • Mitsuru Oonuma
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Clinical analyzer
    • Patent number D681227
    • Issue date Apr 30, 2013
    • Hitachi High-Technologies Corporation
    • Mitsuru Oonuma
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Input and output buffer module for clinical analyzer
    • Patent number D681228
    • Issue date Apr 30, 2013
    • Hitachi High-Technologies Corporation
    • Mitsuru Oonuma
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Automatic analyzer and sample-processing system
    • Patent number 8,252,233
    • Issue date Aug 28, 2012
    • Hitachi High-Technologies Corporation
    • Hitoshi Tokieda
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 8,071,025
    • Issue date Dec 6, 2011
    • Hitachi High-Technologies Corporation
    • Hitoshi Tokieda
    • G01 - MEASURING TESTING
  • Information Patent Grant

    ISE analytical unit for clinical analyzer
    • Patent number D637730
    • Issue date May 10, 2011
    • Hitachi High-Technologies Corporation
    • Mitsuru Oonuma
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Sample buffer unit for clinical analyzer
    • Patent number D631975
    • Issue date Feb 1, 2011
    • Hitachi High-Technologies Corporation
    • Mitsuru Oonuma
    • D24 - Medical and laboratory equipment
  • Information Patent Grant

    Sampler unit for clinical analyzer
    • Patent number D631976
    • Issue date Feb 1, 2011
    • Hitachi High-Technologies Corporation
    • Mitsuru Oonuma
    • D24 - Medical and laboratory equipment

Patents Applicationslast 30 patents

  • Information Patent Application

    ULTRASONIC CLEANER AND AUTOMATIC ANALYZER USING THE SAME
    • Publication number 20210053094
    • Publication date Feb 25, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Yosuke HORIE
    • B08 - CLEANING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20190219604
    • Publication date Jul 18, 2019
    • Hitachi High-Technologies Corporation
    • Takuya TAKAHASHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND SAMPLE-PROCESSING SYSTEM
    • Publication number 20180313862
    • Publication date Nov 1, 2018
    • Hitachi High-Technologies Corporation
    • Hitoshi TOKIEDA
    • Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20180267068
    • Publication date Sep 20, 2018
    • Hitachi High-Technologies Corporation
    • Takamichi MORI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND REAGENT BOTTLE LOADING METHOD
    • Publication number 20180246132
    • Publication date Aug 30, 2018
    • Hitachi High-Technologies Corporation
    • Takamichi MORI
    • G01 - MEASURING TESTING
  • Information Patent Application

    ULTRASONIC CLEANER AND AUTOMATIC ANALYZER USING THE SAME
    • Publication number 20180161829
    • Publication date Jun 14, 2018
    • Hitachi High-Technologies Corporation
    • Yosuke HORIE
    • B08 - CLEANING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20180128847
    • Publication date May 10, 2018
    • Hitachi High-Technologies Corporation
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLING NOZZLE, AUTOMATIC ANALYZER USING THE SAME, AND METHOD OF M...
    • Publication number 20170370957
    • Publication date Dec 28, 2017
    • Hitachi High-Technologies Corporation
    • Yosuke HORIE
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20170010293
    • Publication date Jan 12, 2017
    • Hitachi High-Technologies Corporation
    • Takamichi MORI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20160363604
    • Publication date Dec 15, 2016
    • Hitachi High-Technologies Corporation
    • Akihiro YASUI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER DEVICE
    • Publication number 20160327587
    • Publication date Nov 10, 2016
    • Hitachi High-Technologies Corporation
    • Akihiro YASUI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND SAMPLE-PROCESSING SYSTEM
    • Publication number 20160084864
    • Publication date Mar 24, 2016
    • Hitachi High-Technologies Corporation
    • Hitoshi TOKIEDA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20150204895
    • Publication date Jul 23, 2015
    • Hitachi High-Technologies Corporation
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20140286824
    • Publication date Sep 25, 2014
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20140199779
    • Publication date Jul 17, 2014
    • Hitachi High-Technologies Corporation
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZING SYSTEM
    • Publication number 20120294765
    • Publication date Nov 22, 2012
    • Hitachi High-Technologies Corporation
    • Osamu Watabe
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND SAMPLE-PROCESSING SYSTEM
    • Publication number 20120294764
    • Publication date Nov 22, 2012
    • Hitachi High-Technologies Corporation
    • Hitoshi TOKIEDA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20120070343
    • Publication date Mar 22, 2012
    • Hitachi High-Technologies Corporation
    • Hitoshi Tokieda
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20110256022
    • Publication date Oct 20, 2011
    • Masashi Akutsu
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND SAMPLE-PROCESSING SYSTEM
    • Publication number 20110162438
    • Publication date Jul 7, 2011
    • Hitachi High-Technologies Corporation
    • Hitoshi Tokieda
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND SAMPLE-PROCESSING SYSTEM
    • Publication number 20090162247
    • Publication date Jun 25, 2009
    • Hitoshi TOKIEDA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic analyzer
    • Publication number 20060062692
    • Publication date Mar 23, 2006
    • Hitoshi Tokieda
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic analyzer
    • Publication number 20050207938
    • Publication date Sep 22, 2005
    • Masaaki Hanawa
    • G01 - MEASURING TESTING
  • Information Patent Application

    Reagent container
    • Publication number 20050142040
    • Publication date Jun 30, 2005
    • Masaaki Hanawa
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Sample rack handling system
    • Publication number 20020028157
    • Publication date Mar 7, 2002
    • Katsushi Takahashi
    • G01 - MEASURING TESTING