Hitoshi UENO

Person

Chofu, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method of manufacturing electronic devices with a cap and molding
- Patent number 11,776,860
- Issue date Oct 3, 2023
- Seiko Epson Corporation
- Masataka Kazuno
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device
- Patent number 11,688,727
- Issue date Jun 27, 2023
- Seiko Epson Corporation
- Masataka Kazuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic device
- Patent number 11,659,664
- Issue date May 23, 2023
- Seiko Epson Corporation
- Masataka Kazuno
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Magnetic field measuring device and method for manufacturing magnet...
- Patent number 10,444,300
- Issue date Oct 15, 2019
- Seiko Epson Corporation
- Hitoshi Ueno
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field measuring apparatus and manufacturing method of magn...
- Patent number 10,036,786
- Issue date Jul 31, 2018
- Seiko Epson Corporation
- Hitoshi Ueno
- G01 - MEASURING TESTING
Information Patent Grant
Light divider
- Patent number 9,958,613
- Issue date May 1, 2018
- Seiko Epson Corporation
- Hidekazu Kobayashi
- G02 - OPTICS
Information Patent Grant
Magnetic field measurement apparatus
- Patent number 9,720,058
- Issue date Aug 1, 2017
- Seiko Epson Corporation
- Hitoshi Ueno
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field measurement apparatus
- Patent number 9,274,182
- Issue date Mar 1, 2016
- Seiko Epson Corporation
- Hitoshi Ueno
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC DEVICE
- Publication number 20220087023
- Publication date Mar 17, 2022
- SEIKO EPSON CORPORATION
- Masataka Kazuno
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING ELECTRONIC DEVICE
- Publication number 20220084898
- Publication date Mar 17, 2022
- SEIKO EPSON CORPORATION
- Masataka Kazuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC DEVICE
- Publication number 20220085004
- Publication date Mar 17, 2022
- SEIKO EPSON CORPORATION
- Masataka Kazuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC FIELD MEASURING DEVICE AND METHOD FOR MANUFACTURING MAGNET...
- Publication number 20170363695
- Publication date Dec 21, 2017
- SEIKO EPSON CORPORATION
- Hitoshi UENO
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD MEASURING APPARATUS AND MANUFACTURING METHOD OF MAGN...
- Publication number 20170356969
- Publication date Dec 14, 2017
- SEIKO EPSON CORPORATION
- Hitoshi UENO
- G01 - MEASURING TESTING
Information Patent Application
GAS CELL AND MAGNETIC FIELD MEASURING APPARATUS
- Publication number 20160334475
- Publication date Nov 17, 2016
- SEIKO EPSON CORPORATION
- Hitoshi UENO
- G01 - MEASURING TESTING
Information Patent Application
MAGNETISM DETECTION SENSOR AND MAGNETISM MEASUREMENT APPARATUS
- Publication number 20160291099
- Publication date Oct 6, 2016
- SEIKO EPSON CORPORATION
- Hitoshi UENO
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD MEASUREMENT APPARATUS
- Publication number 20160139216
- Publication date May 19, 2016
- SEIKO EPSON CORPORATION
- Hitoshi UENO
- G01 - MEASURING TESTING
Information Patent Application
LIGHT DIVIDER
- Publication number 20150146298
- Publication date May 28, 2015
- SEIKO EPSON CORPORATION
- Hidekazu KOBAYASHI
- G02 - OPTICS
Information Patent Application
GAS CELL AND MAGNETIC FIELD MEASURING APPARATUS
- Publication number 20130214773
- Publication date Aug 22, 2013
- SEIKO EPSON CORPORATION
- Hitoshi UENO
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD MEASUREMENT APPARATUS
- Publication number 20130093421
- Publication date Apr 18, 2013
- SEIKO EPSON CORPORATION
- Hitoshi UENO
- G01 - MEASURING TESTING

Hitoshi UENO

Person

Patents Grantslast 30 patents

Method of manufacturing electronic devices with a cap and molding

Electronic device

Electronic device

Magnetic field measuring device and method for manufacturing magnet...

Magnetic field measuring apparatus and manufacturing method of magn...

Light divider

Magnetic field measurement apparatus

Magnetic field measurement apparatus

Patents Applicationslast 30 patents

ELECTRONIC DEVICE

METHOD OF MANUFACTURING ELECTRONIC DEVICE

ELECTRONIC DEVICE

MAGNETIC FIELD MEASURING DEVICE AND METHOD FOR MANUFACTURING MAGNET...

MAGNETIC FIELD MEASURING APPARATUS AND MANUFACTURING METHOD OF MAGN...

GAS CELL AND MAGNETIC FIELD MEASURING APPARATUS

MAGNETISM DETECTION SENSOR AND MAGNETISM MEASUREMENT APPARATUS

MAGNETIC FIELD MEASUREMENT APPARATUS

LIGHT DIVIDER

GAS CELL AND MAGNETIC FIELD MEASURING APPARATUS

MAGNETIC FIELD MEASUREMENT APPARATUS