Hitoshi Wakabayashi

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Chofu Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Charge trap evaluation method and semiconductor element
- Patent number 11,652,150
- Issue date May 16, 2023
- Sumitomo Chemical Company, Limited
- Kuniyuki Kakushima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for evaluating electrical defect density of semiconductor la...
- Patent number 11,513,149
- Issue date Nov 29, 2022
- Sumitomo Chemical Company, Limited
- Kuniyuki Kakushima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 9,343,536
- Issue date May 17, 2016
- Kabushiki Kaisha Toshiba
- Wataru Saito
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR EVALUATING ELECTRICAL DEFECT DENSITY OF SEMICONDUCTOR LA...
- Publication number 20200225276
- Publication date Jul 16, 2020
- Sumitomo Chemical Company, Limited
- Kuniyuki KAKUSHIMA
- G01 - MEASURING TESTING
Information Patent Application
CHARGE TRAP EVALUATION METHOD AND SEMICONDUCTOR ELEMENT
- Publication number 20200203493
- Publication date Jun 25, 2020
- Sumitomo Chemical Company, Limited
- Kuniyuki KAKUSHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20160043187
- Publication date Feb 11, 2016
- Kabushiki Kaisha Toshiba
- Wataru Saito
- H01 - BASIC ELECTRIC ELEMENTS