Hitoshi Watarai

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Suita-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Interferometric method for measuring a size of particle in the pres...
- Patent number 10,429,287
- Issue date Oct 1, 2019
- Osaka University
- Makoto Kawano
- G02 - OPTICS
Information Patent Grant
Method for measuring characteristics of a particle and device for m...
- Patent number 10,261,050
- Issue date Apr 16, 2019
- Osaka University
- Makoto Kawano
- G01 - MEASURING TESTING
Information Patent Grant
Porosity measuring device and porosity measuring method
- Patent number 9,366,614
- Issue date Jun 14, 2016
- Osaka University
- Makoto Kawano
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometry and mass spectroscope
- Patent number 7,642,512
- Issue date Jan 5, 2010
- Osaka University
- Hitoshi Watarai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OBSERVATION APPARATUS, DEVICE, DEVICE PRODUCTION METHOD, PARTICLE S...
- Publication number 20160349165
- Publication date Dec 1, 2016
- OSAKA UNIVERSITY
- Makoto KAWANO
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE ANALYSIS METHOD AND PARTICLE ANALYSIS DEVICE
- Publication number 20160209366
- Publication date Jul 21, 2016
- OSAKA UNIVERSITY
- Makoto KAWANO
- G01 - MEASURING TESTING
Information Patent Application
POROSITY MEASURING DEVICE AND POROSITY MEASURING METHOD
- Publication number 20140174157
- Publication date Jun 26, 2014
- OSAKA UNIVERSITY
- Makoto Kawano
- G01 - MEASURING TESTING
Information Patent Application
Mass spectrometry and mass spectroscope
- Publication number 20080217525
- Publication date Sep 11, 2008
- Osaka University
- Hitoshi Watarai
- G01 - MEASURING TESTING