Ho-Hui Lin

Follow

Person

Hsinchu Hsiang, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Probe for high frequency signal transmission
- Patent number 8,106,673
- Issue date Jan 31, 2012
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Probe for high frequency signal transmission and probe card using t...
- Patent number 7,791,359
- Issue date Sep 7, 2010
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Probing device
- Patent number 7,782,070
- Issue date Aug 24, 2010
- MJC Probe Incorporated
- Wei-Cheng Ku
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE FOR HIGH FREQUENCY SIGNAL TRANSMISSION
- Publication number 20100253378
- Publication date Oct 7, 2010
- MPI CORPORATION
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Application
PROBING DEVICE
- Publication number 20090009198
- Publication date Jan 8, 2009
- MJC Probe Incorporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR HIGH FREQUENCY SIGNAL TRANSMISSION AND PROBE CARD USING T...
- Publication number 20080164900
- Publication date Jul 10, 2008
- MJC Probe Incorporation No.
- Wei-Cheng KU
- G01 - MEASURING TESTING