Ho-Ki LYEO

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Daejeon, KR

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Patents Grantslast 30 patents

Information Patent Grant
Computer-aided simulation method for atomic-resolution scanning see...
- Patent number 9,459,278
- Issue date Oct 4, 2016
- Korea Advanced Institute of Science and Technology
- Yong-Hyun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Computer-aided simulation method for atomic-resolution scanning see...
- Patent number 9,081,030
- Issue date Jul 14, 2015
- Korea Advanced Institute of Science and Technology
- Yong-Hyun Kim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Computer-Aided Simulation Method For Atomic-Resolution Scanning See...
- Publication number 20150309072
- Publication date Oct 29, 2015
- Korea Advanced Institute of Science and Technology
- Yong-Hyun KIM
- G01 - MEASURING TESTING
Information Patent Application
Computer-Aided Simulation Method For Atomic-Resolution Scanning See...
- Publication number 20140366229
- Publication date Dec 11, 2014
- Yong-Hyun KIM
- G01 - MEASURING TESTING