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WAFER TEST SYSTEM
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Publication number 20250093387
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Publication date Mar 20, 2025
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XINGR TECHNOLOGIES (ZHEJIANG) LIMITED
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CHOON LEONG LOU
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G01 - MEASURING TESTING
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WAFER TEST CASSETTE
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Publication number 20250093411
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Publication date Mar 20, 2025
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XINGR TECHNOLOGIES (ZHEJIANG) LIMITED
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CHOON LEONG LOU
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G01 - MEASURING TESTING
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WAFER TESTING CASSETTE
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Publication number 20250093386
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Publication date Mar 20, 2025
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XINGR TECHNOLOGIES (ZHEJIANG) LIMITED
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CHOON LEONG LOU
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G01 - MEASURING TESTING
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INTEGRATED CIRCUIT WITH GUARD RING
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Publication number 20240088027
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Publication date Mar 14, 2024
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Taiwan Semiconductor Manufacturing Company, Ltd.
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Chiao-Han LEE
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H01 - BASIC ELECTRIC ELEMENTS
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BAND-PASS FILTER AND METHOD
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Publication number 20230378910
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Publication date Nov 23, 2023
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Taiwan Semiconductor Manufacturing Company, Ltd.
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Chi-Hsien LIN
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H03 - BASIC ELECTRONIC CIRCUITRY
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LAYOUT DESIGN FOR RF CIRCUIT
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Publication number 20230282644
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Publication date Sep 7, 2023
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Taiwan Semiconductor Manufacturing Company, Ltd.
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Ho-Hsiang CHEN
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H01 - BASIC ELECTRIC ELEMENTS
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OSCILLATOR CIRCUIT AND DEVICE
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Publication number 20220263464
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Publication date Aug 18, 2022
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Taiwan Semiconductor Manufacturing Company, Ltd.
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Chi-Hsien LIN
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H03 - BASIC ELECTRONIC CIRCUITRY
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DIFFERENTIAL OSCILLATOR CIRCUIT
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Publication number 20220255504
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Publication date Aug 11, 2022
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Taiwan Semiconductor Manufacturing Company, Ltd.
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Chi-Hsien LIN
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H03 - BASIC ELECTRONIC CIRCUITRY
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INTEGRATED CIRCUIT WITH GUARD RING
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Publication number 20210358844
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Publication date Nov 18, 2021
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Taiwan Semiconductor Manufacturing Company, Ltd.
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Chiao-Han LEE
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H01 - BASIC ELECTRIC ELEMENTS
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