Ho Sang YOU

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Seoul, KR

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for measuring round-trip time of test signal u...
- Patent number 11,031,091
- Issue date Jun 8, 2021
- UniTest Inc.
- Ho Sang You
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
System for simultaneously determining memory test result
- Patent number 9,378,845
- Issue date Jun 28, 2016
- Unitest Inc.
- Ho Sang You
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for acquiring data of fast fail memory
- Patent number 9,312,030
- Issue date Apr 12, 2016
- Unitest Inc.
- Ho Sang You
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for correcting output signal of FPGA-based mem...
- Patent number 9,197,212
- Issue date Nov 24, 2015
- UniTest Inc.
- Ho Sang You
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR MEASURING ROUND-TRIP TIME OF TEST SIGNAL U...
- Publication number 20180261304
- Publication date Sep 13, 2018
- Unitest Inc.
- Ho Sang YOU
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
APPARATUS AND METHOD FOR ACQUIRING DATA OF FAST FAIL MEMORY
- Publication number 20150039951
- Publication date Feb 5, 2015
- UNITEST INC.
- Ho Sang YOU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR CORRECTING OUTPUT SIGNAL OF FPGA-BASED MEM...
- Publication number 20150035561
- Publication date Feb 5, 2015
- UNITEST INC.
- Ho Sang YOU
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SYSTEM FOR SIMULTANEOUSLY DETERMINING MEMORY TEST RESULT
- Publication number 20150039953
- Publication date Feb 5, 2015
- UNITEST INC.
- Ho Sang YOU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE FOR CALCULATING ROUND-TRIP TIME OF MEMORY TEST USING PROGRAM...
- Publication number 20150039264
- Publication date Feb 5, 2015
- UNITEST INC.
- Ho Sang YOU
- G01 - MEASURING TESTING