Hoite Pieter Theodoor Tolsma

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Alignment systems and methods for lithographic systems
- Patent number 8,139,217
- Issue date Mar 20, 2012
- ASML Netherlands B.V.
- Franciscus Bernardus Maria Van Bilsen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Alignment systems and methods for lithographic systems
- Patent number 7,880,880
- Issue date Feb 1, 2011
- ASML Netherlands B.V.
- Franciscus Bernardus Maria Van Bilsen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Alignment systems and methods for lithographic systems
- Patent number 7,439,531
- Issue date Oct 21, 2008
- ASML Netherlands B.V.
- Franciscus Bernardus Maria Van Bilsen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of characterization, method of characterizing a process oper...
- Patent number 7,410,735
- Issue date Aug 12, 2008
- ASML Netherlands B.V.
- Maria Elisabeth Reuhman-Huisken
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for vibration detection and vibration analysis...
- Patent number 7,409,302
- Issue date Aug 5, 2008
- ASML Netherlands B.V.
- Haico Victor Kok
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Alignment systems and methods for lithographic systems
- Patent number 7,332,732
- Issue date Feb 19, 2008
- ASML Netherlands, B.V.
- Franciscus Bernardus Maria Van Bilsen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Alignment systems and methods for lithographic systems
- Patent number 7,329,888
- Issue date Feb 12, 2008
- ASML Netherlands B.V.
- Franciscus Bernardus Maria Van Bilsen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Alignment systems and methods for lithographic systems
- Patent number 7,297,971
- Issue date Nov 20, 2007
- ASML Netherlands B.V.
- Franciscus Bernardus Maria Van Bilsen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Alignment system and method and device manufactured thereby
- Patent number 7,259,828
- Issue date Aug 21, 2007
- ASML Netherlands B.V.
- Hoite Pieter Theodoor Tolsma
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithographic apparatus with alignment subsystem, device manufacturi...
- Patent number 7,002,667
- Issue date Feb 21, 2006
- ASML, Netherlands B.V.
- Leon Martin Levasier
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithographic apparatus with alignment subsystem, device manufacturi...
- Patent number 6,995,831
- Issue date Feb 7, 2006
- ASML Netherlands B.V.
- Leon Martin Levasier
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
ALIGNMENT SYSTEMS AND METHODS FOR LITHOGRAPHIC SYSTEMS
- Publication number 20110128520
- Publication date Jun 2, 2011
- ASML NETHERLANDS B.V.
- Franciscus Bernardus Maria Van Bilsen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Lithographic Apparatus and Device Manufacturing Method
- Publication number 20100123886
- Publication date May 20, 2010
- ASML NETHERLANDS B.V.
- Franciscus Godefridus Casper BIJNEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Alignment systems and methods for lithographic systems
- Publication number 20060091330
- Publication date May 4, 2006
- ASML NETHERLANDS B.V.
- Franciscus Bernardus Maria Van Bilsen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Alignment system and method and device manufactured thereby
- Publication number 20050254030
- Publication date Nov 17, 2005
- ASML NETHERLANDS B.V.
- Hoite Pieter Theodoor Tolsma
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Hoite Pieter Theodoor Tolsma

Person

Patents Grantslast 30 patents

Alignment systems and methods for lithographic systems

Alignment systems and methods for lithographic systems

Alignment systems and methods for lithographic systems

Method of characterization, method of characterizing a process oper...

Method and apparatus for vibration detection and vibration analysis...

Alignment systems and methods for lithographic systems

Alignment systems and methods for lithographic systems

Alignment systems and methods for lithographic systems

Alignment system and method and device manufactured thereby

Lithographic apparatus with alignment subsystem, device manufacturi...

Lithographic apparatus with alignment subsystem, device manufacturi...

Patents Applicationslast 30 patents

ALIGNMENT SYSTEMS AND METHODS FOR LITHOGRAPHIC SYSTEMS

Lithographic Apparatus and Device Manufacturing Method

Alignment systems and methods for lithographic systems

Alignment system and method and device manufactured thereby