Hojo Masayasu

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Delay failure test circuit
- Patent number 7,640,124
- Issue date Dec 29, 2009
- Fujitsu Microelectronics Limited
- Hideaki Konishi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit having regularly arranged transist...
- Patent number 5,694,078
- Issue date Dec 2, 1997
- Fujitsu Limited
- Katsunobu Nomura
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Delay failure test circuit
- Publication number 20070288184
- Publication date Dec 13, 2007
- FUJITSU LIMITED
- Hideaki Konishi
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit device
- Publication number 20030041275
- Publication date Feb 27, 2003
- FUJITSU LIMITED
- Shigeru Nishio
- G06 - COMPUTING CALCULATING COUNTING