Hojun LEE

Person

Uiwang-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Nonvolatile memory device and method of operating a nonvolatile memory
- Patent number 11,798,626
- Issue date Oct 24, 2023
- Samsung Electronics Co., Ltd.
- Chaehoon Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Nonvolatile memory device and method of operating a nonvolatile memory
- Patent number 11,475,956
- Issue date Oct 18, 2022
- Samsung Electronics Co., Ltd.
- Chaehoon Kim
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
DEVICE FOR MEASURING SEMICONDUCTORS
- Publication number 20250224328
- Publication date Jul 10, 2025
- Samsung Electronics Co., Ltd.
- Sangwoo BAE
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INSPECTION APPARATUS
- Publication number 20250198945
- Publication date Jun 19, 2025
- Samsung Electronics Co., Ltd.
- Junho Shin
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR PACKAGE
- Publication number 20250105193
- Publication date Mar 27, 2025
- Samsung Electronics Co., Ltd.
- Jungmin Ko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND ELECTRONIC SYSTEM INCLUDING THE SAME
- Publication number 20250048627
- Publication date Feb 6, 2025
- Samsung Electronics Co., Ltd.
- Jaehyeok Heo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240418645
- Publication date Dec 19, 2024
- Samsung Electronics Co., Ltd.
- Hojun Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTILAYER CAPACITOR
- Publication number 20240339267
- Publication date Oct 10, 2024
- Samsung Electro-Mechanics Co., Ltd.
- Taekjung Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANAGING SEMICONDUCTOR PROCESSING APPARATUS
- Publication number 20240272561
- Publication date Aug 15, 2024
- Samsung Electronics Co., Ltd.
- Junho SHIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD
- Publication number 20240219315
- Publication date Jul 4, 2024
- Samsung Electronics Co., Ltd.
- Jangwoon Sung
- G01 - MEASURING TESTING
Information Patent Application
NON-VOLATILE MEMORY DEVICE INCLUDING PASS TRANSISTOR
- Publication number 20230019217
- Publication date Jan 19, 2023
- Samsung Electronics Co., Ltd.
- Tackhwi LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NONVOLATILE MEMORY DEVICE AND METHOD OF OPERATING A NONVOLATILE MEMORY
- Publication number 20230018305
- Publication date Jan 19, 2023
- Samsung Electronics Co., Ltd.
- Chaehoon KIM
- G11 - INFORMATION STORAGE
Information Patent Application
NONVOLATILE MEMORY DEVICE AND METHOD OF OPERATING A NONVOLATILE MEMORY
- Publication number 20220139457
- Publication date May 5, 2022
- Samsung Electronics Co., Ltd.
- Chaehoon KIM
- G11 - INFORMATION STORAGE

Person

Patents Grantslast 30 patents

Nonvolatile memory device and method of operating a nonvolatile memory

Nonvolatile memory device and method of operating a nonvolatile memory

Patents Applicationslast 30 patents

DEVICE FOR MEASURING SEMICONDUCTORS

SEMICONDUCTOR INSPECTION APPARATUS

SEMICONDUCTOR PACKAGE

SEMICONDUCTOR DEVICE AND ELECTRONIC SYSTEM INCLUDING THE SAME

SEMICONDUCTOR MEASUREMENT APPARATUS

MULTILAYER CAPACITOR

METHOD OF MANAGING SEMICONDUCTOR PROCESSING APPARATUS

SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD

NON-VOLATILE MEMORY DEVICE INCLUDING PASS TRANSISTOR

NONVOLATILE MEMORY DEVICE AND METHOD OF OPERATING A NONVOLATILE MEMORY

NONVOLATILE MEMORY DEVICE AND METHOD OF OPERATING A NONVOLATILE MEMORY