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Holger Kohr
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Eindhoven, NL
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Patents Grants
last 30 patents
Information
Patent Grant
Bifocal electron microscope
Patent number
12,216,068
Issue date
Feb 4, 2025
FEI Company
Alexander Henstra
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron diffraction holography
Patent number
11,906,450
Issue date
Feb 20, 2024
FEI Company
Alexander Henstra
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Auto-tuning stage settling time with feedback in charged particle m...
Patent number
11,887,809
Issue date
Jan 30, 2024
FEI Company
Yuchen Deng
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron diffraction holography
Patent number
11,460,419
Issue date
Oct 4, 2022
FEI Company
Alexander Henstra
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Simultaneous TEM and STEM microscope
Patent number
11,404,241
Issue date
Aug 2, 2022
FEI Company
Alexander Henstra
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of imaging a sample using an electron microscope
Patent number
10,937,625
Issue date
Mar 2, 2021
FEI Company
Erik Michiel Franken
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for energy resolved chroma imaging
Patent number
10,923,308
Issue date
Feb 16, 2021
FEI Company
Yuchen Deng
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
BIFOCAL ELECTRON MICROSCOPE
Publication number
20240272100
Publication date
Aug 15, 2024
FEI Company
Alexander Henstra
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF AUTOMATED DATA ACQUISITION FOR A TRANSMISSION ELECTRON MI...
Publication number
20240128050
Publication date
Apr 18, 2024
FEI Company
Yuchen DENG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Automated Selection And Model Training For Charged Particle Microsc...
Publication number
20240071051
Publication date
Feb 29, 2024
FEI Company
John Francis Flanagan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
AUTOMATIC PARTICLE BEAM FOCUSING
Publication number
20230245291
Publication date
Aug 3, 2023
FEI Company
Yuchen Deng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
AUTO-TUNING STAGE SETTLING TIME WITH FEEDBACK IN CHARGED PARTICLE M...
Publication number
20230238207
Publication date
Jul 27, 2023
FEI Company
Yuchen Deng
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRON DIFFRACTION HOLOGRAPHY
Publication number
20230003672
Publication date
Jan 5, 2023
FEI Company
Alexander Henstra
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
AREA SELECTION IN CHARGED PARTICLE MICROSCOPE IMAGING
Publication number
20220414855
Publication date
Dec 29, 2022
FEI Company
Yuchen DENG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SPARSE IMAGE RECONSTRUCTION FROM NEIGHBORING TOMOGRAPHY TILT IMAGES
Publication number
20220373481
Publication date
Nov 24, 2022
FEI Company
Maurice Peemen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ELECTRON DIFFRACTION HOLOGRAPHY
Publication number
20210302333
Publication date
Sep 30, 2021
FEI Company
Alexander Henstra
G01 - MEASURING TESTING
Information
Patent Application
DUAL BEAM BIFOCAL CHARGED PARTICLE MICROSCOPE
Publication number
20210305007
Publication date
Sep 30, 2021
FEI Company
Alexander Henstra
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SIMULTANEOUS TEM AND STEM MICROSCOPE
Publication number
20210305012
Publication date
Sep 30, 2021
FEI Company
Alexander Henstra
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF IMAGING A SAMPLE USING AN ELECTRON MICROSCOPE
Publication number
20200168433
Publication date
May 28, 2020
FEI Company
Erik Michiel Franken
H01 - BASIC ELECTRIC ELEMENTS