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Ludwigshafen, DE
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last 30 patents
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Patent Grant
Inspection device and inspection method for the optical examination...
Patent number
8,289,509
Issue date
Oct 16, 2012
NanoPhotonics AG
Holger Wenz
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Inspection device and inspection method for the optical examination...
Publication number
20100195097
Publication date
Aug 5, 2010
NANOPHOTONICS AG
Holger Wenz
G01 - MEASURING TESTING