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Holm Geisler
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Dresden, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Detecting anomalous weak BEOL sites in a metallization system
Patent number
9,021,894
Issue date
May 5, 2015
GLOBALFOUNDRIES Inc.
Vivian W. Ryan
G01 - MEASURING TESTING
Information
Patent Grant
Detecting anomalous stiff pillar bumps formed above a metallization...
Patent number
8,950,269
Issue date
Feb 10, 2015
GLOBALFOUNDRIES Inc.
Vivian W. Ryan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Repairing anomalous stiff pillar bumps
Patent number
8,829,675
Issue date
Sep 9, 2014
GLOBALFOUNDRIES Inc.
Vivian W. Ryan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Repairing anomalous stiff pillar bumps
Patent number
8,623,754
Issue date
Jan 7, 2014
GLOBALFOUNDRIES Inc.
Vivian W. Ryan
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Assessing metal stack integrity in sophisticated semiconductor devi...
Patent number
8,479,578
Issue date
Jul 9, 2013
GLOBALFOUNDRIES Inc.
Holm Geisler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for determining surface characteristics by usi...
Patent number
7,441,446
Issue date
Oct 28, 2008
Advanced Micro Devices, Inc.
Dmytro Chumakov
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
REPAIRING ANOMALOUS STIFF PILLAR BUMPS
Publication number
20140077368
Publication date
Mar 20, 2014
GLOBALFOUNDRIES INC.
Vivian W. Ryan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
REPAIRING ANOMALOUS STIFF PILLAR BUMPS
Publication number
20140027902
Publication date
Jan 30, 2014
GLOBALFOUNDRIES INC.
Vivian W. Ryan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DETECTING ANOMALOUS STIFF PILLAR BUMPS FORMED ABOVE A METALLIZATION...
Publication number
20140026675
Publication date
Jan 30, 2014
GLOBALFOUNDRIES INC.
Vivian W. Ryan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DETECTING ANOMALOUS WEAK BEOL SITES IN A METALLIZATION SYSTEM
Publication number
20140026676
Publication date
Jan 30, 2014
GLOBALFOUNDRIES INC.
Vivian W. Ryan
G01 - MEASURING TESTING
Information
Patent Application
Metal Features to Reduce Crack-Inducing Stresses in Metallization S...
Publication number
20130087907
Publication date
Apr 11, 2013
GLOBALFOUNDRIES INC.
Matthias U. Lehr
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ASSESSING METAL STACK INTEGRITY IN SOPHISTICATED SEMICONDUCTOR DEVI...
Publication number
20110209548
Publication date
Sep 1, 2011
Holm Geisler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND APPARATUS FOR DETERMINING SURFACE CHARACTERISTICS BY USI...
Publication number
20070044544
Publication date
Mar 1, 2007
Dmytro Chumakov
G01 - MEASURING TESTING