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Patents Grants
last 30 patents
Information
Patent Grant
Rotating field sensor
Patent number
10,648,787
Issue date
May 12, 2020
TDK Corporation
Yohei Hirota
G01 - MEASURING TESTING
Information
Patent Grant
Rotating field sensor
Patent number
10,386,169
Issue date
Aug 20, 2019
TDK Corporation
Yohei Hirota
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor with reduced effect of interlayer coupling magnetic...
Patent number
9,389,286
Issue date
Jul 12, 2016
TDK Corporation
Hiroshi Yamazaki
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor system including two detection circuits
Patent number
9,297,635
Issue date
Mar 29, 2016
TDK Corporation
Homare Tokida
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor with reduced effect of interlayer coupling magnetic...
Patent number
9,244,136
Issue date
Jan 26, 2016
TDK Corporation
Hiroshi Yamazaki
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor system including three detection circuits
Patent number
9,200,884
Issue date
Dec 1, 2015
TDK Corporation
Kunihiro Ueda
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MAGNETIC SENSOR, SIGNAL PROCESSING CIRCUIT, AND MAGNETIC SENSOR DEVICE
Publication number
20230089798
Publication date
Mar 23, 2023
TDK Corporation
Kenkichi ANAGAWA
G01 - MEASURING TESTING
Information
Patent Application
ROTATING FIELD SENSOR
Publication number
20190316894
Publication date
Oct 17, 2019
TDK Corporation
Yohei HIROTA
G01 - MEASURING TESTING
Information
Patent Application
ROTATING FIELD SENSOR
Publication number
20160169707
Publication date
Jun 16, 2016
TDK Corporation
Yohei HIROTA
G01 - MEASURING TESTING
Information
Patent Application
ROTATING FIELD SENSOR
Publication number
20150066426
Publication date
Mar 5, 2015
TDK Corporation
Yohei HIROTA
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC SENSOR WITH REDUCED EFFECT OF INTERLAYER COUPLING MAGNETIC...
Publication number
20140292321
Publication date
Oct 2, 2014
TDK Corporation
Hiroshi YAMAZAKI
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC SENSOR WITH REDUCED EFFECT OF INTERLAYER COUPLING MAGNETIC...
Publication number
20140292322
Publication date
Oct 2, 2014
TDK Corporation
Hiroshi YAMAZAKI
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC SENSOR SYSTEM INCLUDING THREE DETECTION CIRCUITS
Publication number
20140292313
Publication date
Oct 2, 2014
TDK Corporation
Kunihiro UEDA
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC SENSOR SYSTEM INCLUDING TWO DETECTION CIRCUITS
Publication number
20140292314
Publication date
Oct 2, 2014
TDK Corporation
Homare TOKIDA
G01 - MEASURING TESTING