Homi E. Nariman

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods of calibrating and controlling stepper exposure processes a...
- Patent number 6,972,853
- Issue date Dec 6, 2005
- Advanced Micro Devices, Inc.
- James Broc Stirton
- G01 - MEASURING TESTING
Information Patent Grant
Method of monitoring anneal processes using scatterometry, and syst...
- Patent number 6,933,158
- Issue date Aug 23, 2005
- Advanced Micro Devices, Inc.
- Kevin R. Lensing
- G01 - MEASURING TESTING
Information Patent Grant
Structures for analyzing electromigration, and methods of using same
- Patent number 6,927,080
- Issue date Aug 9, 2005
- Advanced Micro Devices, Inc.
- Homi E. Nariman
- G01 - MEASURING TESTING
Information Patent Grant
Method of using scatterometry for analysis of electromigration, and...
- Patent number 6,881,594
- Issue date Apr 19, 2005
- Advanced Micro Devices, Inc.
- James Broc Stirton
- G01 - MEASURING TESTING
Information Patent Grant
Scatterometry structure with embedded ring oscillator, and methods...
- Patent number 6,791,697
- Issue date Sep 14, 2004
- Advanced Micro Devices, Inc.
- Homi E. Nariman
- G01 - MEASURING TESTING
Information Patent Grant
Method of making a shaped gate electrode structure, and device comp...
- Patent number 6,767,835
- Issue date Jul 27, 2004
- Advanced Micro Devices, Inc.
- Homi E. Nariman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and structure for calibrating scatterometry-based metrology...
- Patent number 6,742,168
- Issue date May 25, 2004
- Advanced Micro Devices, Inc.
- Homi E. Nariman
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring implant profiles using scatterometric technique...
- Patent number 6,660,543
- Issue date Dec 9, 2003
- Advanced Micro Devices, Inc.
- James Broc Stirton
- G01 - MEASURING TESTING
Information Patent Grant
Method of forming silicon oxynitride films
- Patent number 6,372,668
- Issue date Apr 16, 2002
- Advanced Micro Devices, Inc.
- Sey-Ping Sun
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Self-aligning silicon oxynitride stack for improved isolation struc...
- Patent number 6,265,283
- Issue date Jul 24, 2001
- Advanced Micro Devices, Inc.
- Homi E. Nariman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having patterned metal layer over a polysilico...
- Patent number 6,249,032
- Issue date Jun 19, 2001
- Advanced Micro Devices, Inc.
- Homi E. Nariman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-reliability damascene interconnect formation for semiconductor...
- Patent number 6,157,081
- Issue date Dec 5, 2000
- Advanced Micro Devices, Inc.
- Homi E. Nariman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having self-aligned asymmetric source/drain re...
- Patent number 6,146,952
- Issue date Nov 14, 2000
- Advanced Micro Devices
- Homi E. Nariman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating a semiconductor device having polysilicon lin...
- Patent number 6,096,643
- Issue date Aug 1, 2000
- Advanced Micro Devices, Inc.
- Homi E. Nariman
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method Of Forming Silicon Oxynitride Films
- Publication number 20010044220
- Publication date Nov 22, 2001
- Sey-Ping Sun
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Homi E. Nariman

Person

Patents Grantslast 30 patents

Methods of calibrating and controlling stepper exposure processes a...

Method of monitoring anneal processes using scatterometry, and syst...

Structures for analyzing electromigration, and methods of using same

Method of using scatterometry for analysis of electromigration, and...

Scatterometry structure with embedded ring oscillator, and methods...

Method of making a shaped gate electrode structure, and device comp...

Method and structure for calibrating scatterometry-based metrology...

Method of measuring implant profiles using scatterometric technique...

Method of forming silicon oxynitride films

Self-aligning silicon oxynitride stack for improved isolation struc...

Semiconductor device having patterned metal layer over a polysilico...

High-reliability damascene interconnect formation for semiconductor...

Semiconductor device having self-aligned asymmetric source/drain re...

Method of fabricating a semiconductor device having polysilicon lin...

Patents Applicationslast 30 patents

Method Of Forming Silicon Oxynitride Films