Hong Chen

Person

Cupertino, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Erase operation with electron injection for reduction of cell-to-ce...
- Patent number 12,211,548
- Issue date Jan 28, 2025
- Micron Technology, Inc.
- Hong-Yan Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Managing sub-block erase operations in a memory sub-system
- Patent number 12,068,037
- Issue date Aug 20, 2024
- Micron Technology, Inc.
- Kalyan Chakravarthy Kavalipurapu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Unselected sub-block source line and bit line pre-charging to reduc...
- Patent number 11,894,069
- Issue date Feb 6, 2024
- Micron Technology, Inc.
- Xiangyu Yang
- G11 - INFORMATION STORAGE
Information Patent Grant
Setting up inspection of a specimen
- Patent number 11,748,872
- Issue date Sep 5, 2023
- KLA Corp.
- Hong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Managing sub-block erase operations in a memory sub-system
- Patent number 11,749,353
- Issue date Sep 5, 2023
- Micron Technology, Inc.
- Kalyan Chakravarthy Kavalipurapu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Short program verify recovery with reduced programming disturbance...
- Patent number 11,749,359
- Issue date Sep 5, 2023
- Micron Technology, Inc.
- Hong-Yan Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Short program verify recovery with reduced programming disturbance...
- Patent number 11,688,471
- Issue date Jun 27, 2023
- Micron Technology, Inc.
- Hong-Yan Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Pre-boosting scheme during a program operation in a memory sub-system
- Patent number 11,670,372
- Issue date Jun 6, 2023
- Micron Technology, Inc.
- Hong-Yan Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Managing sub-block erase operations in a memory sub-system
- Patent number 11,335,412
- Issue date May 17, 2022
- Micron Technology, Inc.
- Kalyan Chakravarthy Kavalipurapu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Print check repeater defect detection
- Patent number 11,328,411
- Issue date May 10, 2022
- KLA Corp.
- Hong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Short program verify recovery with reduced programming disturbance...
- Patent number 11,282,582
- Issue date Mar 22, 2022
- Micron Technology, Inc.
- Hong-Yan Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for semiconductor device print check alignment
- Patent number 11,201,074
- Issue date Dec 14, 2021
- KLA Corporation
- Hong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pre-boosting scheme during a program operation in a memory sub-system
- Patent number 11,183,245
- Issue date Nov 23, 2021
- Micron Technology, Inc.
- Hong-Yan Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
High accuracy of relative defect locations for repeater analysis
- Patent number 11,067,516
- Issue date Jul 20, 2021
- KLA-Tencor Corp.
- Shishir Suman
- G01 - MEASURING TESTING
Information Patent Grant
Method of reducing injection type of program disturb during program...
- Patent number 10,811,110
- Issue date Oct 20, 2020
- SanDisk Technologies LLC
- Hong-Yan Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Maintaining channel pre-charge in program operation
- Patent number 10,790,003
- Issue date Sep 29, 2020
- SanDisk Technologies LLC
- Hong-Yan Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of reducing injection type of program disturb during program...
- Patent number 10,770,157
- Issue date Sep 8, 2020
- SanDisk Technologies LLC
- Hong-Yan Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Reducing neighbor word line interference in a two-tier memory devic...
- Patent number 10,748,627
- Issue date Aug 18, 2020
- SanDisk Technologies LLC
- Hong-Yan Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reducing read disturb in two-tier memory device by modifying durati...
- Patent number 10,685,723
- Issue date Jun 16, 2020
- SanDisk Technologies LLC
- Hong-Yan Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device with discharge voltage pulse to reduce injection type...
- Patent number 10,665,306
- Issue date May 26, 2020
- SanDisk Technologies LLC
- Hong-Yan Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device with channel discharge before program-verify based on...
- Patent number 10,665,299
- Issue date May 26, 2020
- SanDisk Technologies LLC
- Ching-Huang Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reducing read disturb in two-tier memory device by modifying ramp u...
- Patent number 10,636,500
- Issue date Apr 28, 2020
- SanDisk Technologies LLC
- Hong-Yan Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Two-stage ramp up of word line voltages in memory device to suppres...
- Patent number 10,629,272
- Issue date Apr 21, 2020
- SanDisk Technologies LLC
- Ching-Huang Lu
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device with charge isolation to reduce injection type of pro...
- Patent number 10,593,411
- Issue date Mar 17, 2020
- SanDisk Technologies LLC
- Hong-Yan Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for aligning semiconductor device reference image...
- Patent number 10,572,991
- Issue date Feb 25, 2020
- KLA-Tencor Corporation
- Hong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory device with vpass step to reduce hot carrier injection type...
- Patent number 10,522,232
- Issue date Dec 31, 2019
- SanDisk Technologies LLC
- Hong-Yan Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Reducing program disturb by modifying word line voltages at interfa...
- Patent number 10,438,671
- Issue date Oct 8, 2019
- SanDisk Technologies LLC
- Hong-Yan Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Computation pipeline of single-pass multiple variant calls
- Patent number 10,424,395
- Issue date Sep 24, 2019
- Jun Ye
Information Patent Grant
Computation pipeline of location-dependent variant calls
- Patent number 10,424,396
- Issue date Sep 24, 2019
- Jun Ye
Information Patent Grant
Reducing disturbs with delayed ramp up of selected word line voltag...
- Patent number 10,283,202
- Issue date May 7, 2019
- SanDisk Technologies LLC
- Hong-Yan Chen
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
DEEP LEARNING MODEL-BASED ALIGNMENT FOR SEMICONDUCTOR APPLICATIONS
- Publication number 20240095935
- Publication date Mar 21, 2024
- KLA Corporation
- Hong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICES WITH PROGRAM VERIFY LEVELS BASED ON COMPENSATION VALUES
- Publication number 20240071531
- Publication date Feb 29, 2024
- Micron Technology, Inc.
- Tomoko Ogura Iwasaki
- G11 - INFORMATION STORAGE
Information Patent Application
CORRECTIVE PROGRAM VERIFY OPERATION WITH IMPROVED READ WINDOW BUDGE...
- Publication number 20240071530
- Publication date Feb 29, 2024
- Micron Technology, Inc.
- Ching-Huang Lu
- G11 - INFORMATION STORAGE
Information Patent Application
MANAGING SUB-BLOCK ERASE OPERATIONS IN A MEMORY SUB-SYSTEM
- Publication number 20230360709
- Publication date Nov 9, 2023
- Micron Technology, Inc.
- Kalyan Chakravarthy Kavalipurapu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ERASE OPERATION WITH ELECTRON INJECTION FOR REDUCTION OF CELL-TO-CE...
- Publication number 20230206999
- Publication date Jun 29, 2023
- Micron Technology, Inc.
- Hong-Yan Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROGRAM SCHEME FOR EDGE DATA WORDLINES IN A MEMORY DEVICE
- Publication number 20230162796
- Publication date May 25, 2023
- Micron Technology, Inc.
- Hong-Yan Chen
- G11 - INFORMATION STORAGE
Information Patent Application
UNSELECTED SUB-BLOCK SOURCE LINE AND BIT LINE PRE-CHARGING TO REDUC...
- Publication number 20230024346
- Publication date Jan 26, 2023
- Micron Technology, Inc.
- Xiangyu Yang
- G11 - INFORMATION STORAGE
Information Patent Application
MANAGING SUB-BLOCK ERASE OPERATIONS IN A MEMORY SUB-SYSTEM
- Publication number 20220277795
- Publication date Sep 1, 2022
- Micron Technology, Inc.
- Kalyan Chakravarthy Kavalipurapu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHORT PROGRAM VERIFY RECOVERY WITH REDUCED PROGRAMMING DISTURBANCE...
- Publication number 20220215890
- Publication date Jul 7, 2022
- Micron Technology, Inc.
- Hong-Yan Chen
- G11 - INFORMATION STORAGE
Information Patent Application
SHORT PROGRAM VERIFY RECOVERY WITH REDUCED PROGRAMMING DISTURBANCE...
- Publication number 20220189565
- Publication date Jun 16, 2022
- Micron Technology, Inc.
- Hong-Yan Chen
- G11 - INFORMATION STORAGE
Information Patent Application
Setting Up Inspection of a Specimen
- Publication number 20220067898
- Publication date Mar 3, 2022
- KLA Corporation
- Hong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PRE-BOOSTING SCHEME DURING A PROGRAM OPERATION IN A MEMORY SUB-SYSTEM
- Publication number 20220051721
- Publication date Feb 17, 2022
- Micron Technology, Inc.
- Hong-Yan Chen
- G11 - INFORMATION STORAGE
Information Patent Application
MODIFIED SEEDING SCHEME DURING A PROGRAM OPERATION IN A MEMORY SUB-...
- Publication number 20210391016
- Publication date Dec 16, 2021
- Micron Technology, Inc.
- Hong-Yan Chen
- G11 - INFORMATION STORAGE
Information Patent Application
SHORT PROGRAM VERIFY RECOVERY WITH REDUCED PROGRAMMING DISTURBANCE...
- Publication number 20210391024
- Publication date Dec 16, 2021
- Micron Technology, Inc.
- Hong-Yan Chen
- G11 - INFORMATION STORAGE
Information Patent Application
PRINT CHECK REPEATER DEFECT DETECTION
- Publication number 20210342992
- Publication date Nov 4, 2021
- KLA Corporation
- Hong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Semiconductor Device Print Check Alignment
- Publication number 20210242059
- Publication date Aug 5, 2021
- KLA Corporation
- Hong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MANAGING SUB-BLOCK ERASE OPERATIONS IN A MEMORY SUB-SYSTEM
- Publication number 20210202009
- Publication date Jul 1, 2021
- Micron Technology, Inc.
- Kalyan Chakravarthy Kavalipurapu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REDUCING READ DISTURB IN TWO-TIER MEMORY DEVICE BY MODIFYING DURATI...
- Publication number 20200202961
- Publication date Jun 25, 2020
- SANDISK TECHNOLOGIES LLC
- Hong-Yan Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REDUCING NEIGHBOR WORD LINE INTERFERENCE IN A TWO-TIER MEMORY DEVIC...
- Publication number 20200202962
- Publication date Jun 25, 2020
- SANDISK TECHNOLOGIES LLC
- Hong-Yan Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH ACCURACY OF RELATIVE DEFECT LOCATIONS FOR REPEATER ANALYSIS
- Publication number 20200072763
- Publication date Mar 5, 2020
- KLA-Tencor Corporation
- Shishir Suman
- G01 - MEASURING TESTING
Information Patent Application
MEMORY DEVICE WITH VPASS STEP TO REDUCE HOT CARRIER INJECTION TYPE...
- Publication number 20190355429
- Publication date Nov 21, 2019
- SanDisk Technologies LLC
- Hong-Yan Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REDUCING DISTURBS WITH DELAYED RAMP UP OF SELECTED WORD LINE VOLTAG...
- Publication number 20190147955
- Publication date May 16, 2019
- SanDisk Technologies LLC
- Hong-Yan Chen
- G11 - INFORMATION STORAGE
Information Patent Application
REDUCING PROGRAM DISTURB BY MODIFYING WORD LINE VOLTAGES AT INTERFA...
- Publication number 20190147962
- Publication date May 16, 2019
- SanDisk Technologies LLC
- Hong-Yan Chen
- G11 - INFORMATION STORAGE
Information Patent Application
System and Method for Aligning Semiconductor Device Reference Image...
- Publication number 20190139208
- Publication date May 9, 2019
- KLA-Tencor Corporation
- Hong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Reducing Hot Electron Injection Type Of Read Disturb In 3D Memory D...
- Publication number 20190074062
- Publication date Mar 7, 2019
- SanDisk Technologies LLC
- Hong-Yan Chen
- G11 - INFORMATION STORAGE
Information Patent Application
Reducing Hot Electron Injection Type Of Read Disturb In 3D Memory D...
- Publication number 20190057749
- Publication date Feb 21, 2019
- SanDisk Technologies LLC
- Hong-Yan Chen
- G11 - INFORMATION STORAGE
Information Patent Application
Reducing Charge Loss In Data Memory Cell Adjacent To Dummy Memory Cell
- Publication number 20180308556
- Publication date Oct 25, 2018
- SanDisk Technologies LLC
- Ashish Baraskar
- G11 - INFORMATION STORAGE
Information Patent Application
NON-VOLATILE MEMORY WITH CUSTOMIZED CONTROL OF INJECTION TYPE OF DI...
- Publication number 20170352430
- Publication date Dec 7, 2017
- SanDisk Technologies LLC
- Hong-Yan Chen
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEM AND METHOD FOR USER-SPECIFIED PRONUNCIATION OF WORDS FOR SPE...
- Publication number 20170178619
- Publication date Jun 22, 2017
- Apple Inc.
- Devang K. NAIK
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Application
Wafer Defect Discovery
- Publication number 20170076911
- Publication date Mar 16, 2017
- KLA-Tencor Corporation
- Hong Chen
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Erase operation with electron injection for reduction of cell-to-ce...

Managing sub-block erase operations in a memory sub-system

Unselected sub-block source line and bit line pre-charging to reduc...

Setting up inspection of a specimen

Managing sub-block erase operations in a memory sub-system

Short program verify recovery with reduced programming disturbance...

Short program verify recovery with reduced programming disturbance...

Pre-boosting scheme during a program operation in a memory sub-system

Managing sub-block erase operations in a memory sub-system

Print check repeater defect detection

Short program verify recovery with reduced programming disturbance...

System and method for semiconductor device print check alignment

Pre-boosting scheme during a program operation in a memory sub-system

High accuracy of relative defect locations for repeater analysis

Method of reducing injection type of program disturb during program...

Maintaining channel pre-charge in program operation

Method of reducing injection type of program disturb during program...

Reducing neighbor word line interference in a two-tier memory devic...

Reducing read disturb in two-tier memory device by modifying durati...

Memory device with discharge voltage pulse to reduce injection type...

Memory device with channel discharge before program-verify based on...

Reducing read disturb in two-tier memory device by modifying ramp u...

Two-stage ramp up of word line voltages in memory device to suppres...

Memory device with charge isolation to reduce injection type of pro...

System and method for aligning semiconductor device reference image...

Memory device with vpass step to reduce hot carrier injection type...

Reducing program disturb by modifying word line voltages at interfa...

Computation pipeline of single-pass multiple variant calls

Computation pipeline of location-dependent variant calls

Reducing disturbs with delayed ramp up of selected word line voltag...

Patents Applicationslast 30 patents

DEEP LEARNING MODEL-BASED ALIGNMENT FOR SEMICONDUCTOR APPLICATIONS

MEMORY DEVICES WITH PROGRAM VERIFY LEVELS BASED ON COMPENSATION VALUES

CORRECTIVE PROGRAM VERIFY OPERATION WITH IMPROVED READ WINDOW BUDGE...

MANAGING SUB-BLOCK ERASE OPERATIONS IN A MEMORY SUB-SYSTEM

ERASE OPERATION WITH ELECTRON INJECTION FOR REDUCTION OF CELL-TO-CE...

PROGRAM SCHEME FOR EDGE DATA WORDLINES IN A MEMORY DEVICE

UNSELECTED SUB-BLOCK SOURCE LINE AND BIT LINE PRE-CHARGING TO REDUC...

MANAGING SUB-BLOCK ERASE OPERATIONS IN A MEMORY SUB-SYSTEM

SHORT PROGRAM VERIFY RECOVERY WITH REDUCED PROGRAMMING DISTURBANCE...

SHORT PROGRAM VERIFY RECOVERY WITH REDUCED PROGRAMMING DISTURBANCE...

Setting Up Inspection of a Specimen

PRE-BOOSTING SCHEME DURING A PROGRAM OPERATION IN A MEMORY SUB-SYSTEM

MODIFIED SEEDING SCHEME DURING A PROGRAM OPERATION IN A MEMORY SUB-...

SHORT PROGRAM VERIFY RECOVERY WITH REDUCED PROGRAMMING DISTURBANCE...

PRINT CHECK REPEATER DEFECT DETECTION

System and Method for Semiconductor Device Print Check Alignment

MANAGING SUB-BLOCK ERASE OPERATIONS IN A MEMORY SUB-SYSTEM

REDUCING READ DISTURB IN TWO-TIER MEMORY DEVICE BY MODIFYING DURATI...

REDUCING NEIGHBOR WORD LINE INTERFERENCE IN A TWO-TIER MEMORY DEVIC...

HIGH ACCURACY OF RELATIVE DEFECT LOCATIONS FOR REPEATER ANALYSIS

MEMORY DEVICE WITH VPASS STEP TO REDUCE HOT CARRIER INJECTION TYPE...

REDUCING DISTURBS WITH DELAYED RAMP UP OF SELECTED WORD LINE VOLTAG...

REDUCING PROGRAM DISTURB BY MODIFYING WORD LINE VOLTAGES AT INTERFA...

System and Method for Aligning Semiconductor Device Reference Image...

Reducing Hot Electron Injection Type Of Read Disturb In 3D Memory D...

Reducing Hot Electron Injection Type Of Read Disturb In 3D Memory D...

Reducing Charge Loss In Data Memory Cell Adjacent To Dummy Memory Cell

NON-VOLATILE MEMORY WITH CUSTOMIZED CONTROL OF INJECTION TYPE OF DI...

SYSTEM AND METHOD FOR USER-SPECIFIED PRONUNCIATION OF WORDS FOR SPE...

Wafer Defect Discovery