Hong Dai

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San Diego, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Integrated functional and design for testability (DFT) clock delive...
- Patent number 11,934,219
- Issue date Mar 19, 2024
- QUALCOMM Incorporated
- Arvind Jain
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Efficient test architecture for multi-die chips
- Patent number 10,429,441
- Issue date Oct 1, 2019
- QUALCOMM Incorporated
- Tapan Jyoti Chakraborty
- G01 - MEASURING TESTING
Information Patent Grant
System and method for testing high pin count electronic devices usi...
- Patent number 6,862,705
- Issue date Mar 1, 2005
- Applied Micro Circuits Corporation
- Richard T. Nesbitt
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEMORY REPAIR SYSTEM AND METHOD
- Publication number 20240087662
- Publication date Mar 14, 2024
- QUALCOMM Incorporated
- HONG DAI
- G11 - INFORMATION STORAGE
Information Patent Application
INTEGRATED FUNCTIONAL AND DESIGN FOR TESTABILITY (DFT) CLOCK DELIVE...
- Publication number 20230315141
- Publication date Oct 5, 2023
- QUALCOMM Incorporated
- Arvind JAIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EFFICIENT TEST ARCHITECTURE FOR MULTI-DIE CHIPS
- Publication number 20180340977
- Publication date Nov 29, 2018
- QUALCOMM Incorporated
- Tapan Jyoti Chakraborty
- G01 - MEASURING TESTING