Hong-En Shen

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Eatontown, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for determining a material's characteristics b...
- Patent number 5,270,797
- Issue date Dec 14, 1993
- Brooklyn College Foundation
- Fred H. Pollak
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining a material's characteristics b...
- Patent number 5,260,772
- Issue date Nov 9, 1993
- Fred H. Pollak
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining interface properties of semiconductor materi...
- Patent number 5,255,070
- Issue date Oct 19, 1993
- Fred H. Pollak
- G01 - MEASURING TESTING
Information Patent Grant
Photoreflectance method and apparatus utilizing acousto-optic modul...
- Patent number 5,255,071
- Issue date Oct 19, 1993
- Fred H. Pollak
- G01 - MEASURING TESTING