Hong-jun Jin

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Suwon-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Memory device, memory device test method, and test system
- Patent number 12,300,344
- Issue date May 13, 2025
- Samsung Electronics Co., Ltd.
- Hong-Jun Jin
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for interworking between electronic devices
- Patent number 10,172,175
- Issue date Jan 1, 2019
- Samsung Electronics Co., Ltd.
- Sehwan Choi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Multi-socket guide and test device comprising the same
- Patent number 8,029,292
- Issue date Oct 4, 2011
- Samsung Electronics Co., Ltd.
- Hong-jun Jin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEMORY DEVICE, MEMORY DEVICE TEST METHOD, AND TEST SYSTEM
- Publication number 20240220117
- Publication date Jul 4, 2024
- Samsung Electronics Co., Ltd.
- Hong-Jun Jin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR INTERWORKING BETWEEN ELECTRONIC DEVICES
- Publication number 20180020320
- Publication date Jan 18, 2018
- Samsung Electronics Co., Ltd.
- Sehwan Choi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SCREEN CONTROLLING METHOD AND ELECTRONIC DEVICE FOR SUPPORTING THE...
- Publication number 20170344333
- Publication date Nov 30, 2017
- Samsung Electronics Co., Ltd.
- Hong Ik Jin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-SOCKET GUIDE AND TEST DEVICE COMPRISING THE SAME
- Publication number 20100068914
- Publication date Mar 18, 2010
- Hong-jun Jin
- G01 - MEASURING TESTING