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Hong Q. Hou
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Albuquerque, NM, US
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Patents Grants
last 30 patents
Information
Patent Grant
On-wafer burn-in of semiconductor devices using thermal rollover
Patent number
6,936,483
Issue date
Aug 30, 2005
Emcore Corporation
Hong Q. Hou
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for parallel optical transceiver module assembly
Patent number
6,863,453
Issue date
Mar 8, 2005
Emcore Corporation
Charlie X. Wang
G02 - OPTICS
Information
Patent Grant
On-wafer burn-in of semiconductor devices using thermal rollover
Patent number
6,677,172
Issue date
Jan 13, 2004
Emcore Corporation
Hong Q. Hou
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method and apparatus for parallel optical transceiver module assembly
Publication number
20040146253
Publication date
Jul 29, 2004
Charlie X. Wang
G02 - OPTICS
Information
Patent Application
On-wafer burn-in of semiconductor devices using thermal rollover
Publication number
20040119486
Publication date
Jun 24, 2004
Hong Q. Hou
G01 - MEASURING TESTING
Information
Patent Application
ON-WAFER BURN-IN OF SEMICONDUCTOR DEVICES USING THERMAL ROLLOVER
Publication number
20040002175
Publication date
Jan 1, 2004
Hong Q. Hou
G01 - MEASURING TESTING