Hong-Shin Jun

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Programmable test clock generation responsive to clock signal chara...
- Patent number 7,844,875
- Issue date Nov 30, 2010
- Cisco Technology, Inc.
- Hong-Shin Jun
- G01 - MEASURING TESTING
Information Patent Grant
Programmable in-situ delay fault test clock generator
- Patent number 7,536,617
- Issue date May 19, 2009
- Cisco Technology, Inc.
- Hong-Shin Jun
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Programmable Test Clock Generation Responsive to Clock Signal Chara...
- Publication number 20090183046
- Publication date Jul 16, 2009
- Cisco Technology, Inc., A corporation of California
- Hong-Shin JUN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Programmable in-situ delay fault test clock generator
- Publication number 20060242474
- Publication date Oct 26, 2006
- Cisco Technology, Inc.
- Hong-Shin Jun
- G06 - COMPUTING CALCULATING COUNTING