Hongchan Kim

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Gyeonggi-do, KR

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Patents Applicationslast 30 patents

Information Patent Application
Probe substrate and probe card having the same
- Publication number 20090260459
- Publication date Oct 22, 2009
- WILLTECHNOLOGY CO., LTD.
- Hongchan Kim
- G01 - MEASURING TESTING
Information Patent Application
Probe card
- Publication number 20090261850
- Publication date Oct 22, 2009
- WILLTECHNOLOGY CO., LTD.
- Hongchan Kim
- G01 - MEASURING TESTING