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Shanghai, CN
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Patents Grants
last 30 patents
Information
Patent Grant
Lidar systems and methods
Patent number
11,879,999
Issue date
Jan 23, 2024
HESAI TECHNOLOGY CO., LTD.
Jiasheng Li
G01 - MEASURING TESTING
Information
Patent Grant
Lidar
Patent number
D1000978
Issue date
Oct 10, 2023
HESAI TECHNOLOGY CO., LTD.
Shiyu Zhao
D10 - Measuring, testing, or signalling instruments
Information
Patent Grant
Lidar system and method
Patent number
11,474,207
Issue date
Oct 18, 2022
Hesai Technology Co. Ltd.
Rui Wang
G01 - MEASURING TESTING
Information
Patent Grant
Lidar systems and methods
Patent number
11,029,394
Issue date
Jun 8, 2021
HESAI TECHNOLOGY CO., LTD.
Jiasheng Li
G01 - MEASURING TESTING
Information
Patent Grant
Lidar system and method
Patent number
10,429,495
Issue date
Oct 1, 2019
HESAI PHOTONICS TECHNOLOGY CO., LTD.
Rui Wang
G01 - MEASURING TESTING
Information
Patent Grant
Lidar systems and methods
Patent number
10,295,656
Issue date
May 21, 2019
HESAI PHOTONICS TECHNOLOGY CO., LTD.
Jiasheng Li
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
LIDAR SYSTEMS AND METHODS
Publication number
20210255284
Publication date
Aug 19, 2021
Hesai Technology Co., Ltd.
Jiasheng Li
G01 - MEASURING TESTING
Information
Patent Application
LIDAR SYSTEMS AND METHODS
Publication number
20190383915
Publication date
Dec 19, 2019
HESAI PHOTONICS TECHNOLOGY CO., LTD.
Jiasheng Li
G01 - MEASURING TESTING
Information
Patent Application
LIDAR SYSTEM AND METHOD
Publication number
20190369215
Publication date
Dec 5, 2019
HESAI PHOTONICS TECHNOLOGY CO., LTD.
Rui Wang
G01 - MEASURING TESTING
Information
Patent Application
LIDAR SYSTEM AND METHOD
Publication number
20190302235
Publication date
Oct 3, 2019
HESAI PHOTONICS TECHNOLOGY CO., LTD.
Rui Wang
G01 - MEASURING TESTING